Suppressing Growth of the Cu₅Zn₈ Intermetallic Layer in Sn-Zn-Ag-Al-Ga/Cu Solder Joints

摘要

Cu₅Zn₈ normally forms between Sn-Zn solder and Cu metallization. In this study, the growth of the intermetallic compound (IMC) layer is slowed by increasing the silver content in the Sn-8.5Zn-Ag-Al-Ga/Cu system. Experimental results showed that the total thickness of the IMC layers formed with 1.5 wt.% silver content was about half that without silver. The reduction might be due to the formation of the intermetallic compound (Ag,Cu)-Zn at the interface in addition to silver.