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Probabilistic approach for extracting regions of interest in digital images

机译:提取数字图像中感兴趣区域的概率方法

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摘要

We propose an image-understanding algorithm for identifying and ranking regions of perceptually relevant content in digital images. Global features that characterize relations between image regions are fused in a probabilistic framework to generate a region ranking map (RRM) of an arbitrary image. Features are introduced as maps for spatial position, weighted similarity, and weighted homogeneity for image regions. Further analysis of the RRM, based on the receiver operating characteristic curve, has been utilized to generate a binary map that signifies region of interest in the test image. The algorithm includes modules for image segmentation, feature extraction, and probabilistic reasoning. It differs from prior art by using machine learning techniques to discover the optimum Baye-sian Network structure and probabilistic inference. It also eliminates the necessity for semantic understanding at intermediate stages. Experimental results indicate an accuracy rate of ~90% on a set of -4000 color images that are publicly available and compare favorably to state-of-the-art techniques. Applications of the proposed algorithm include smart image and document rendering, content-based image retrieval, adaptive image compression and coding, and automatic image annotation.
机译:我们提出了一种图像理解算法,用于识别和排序数字图像中感知相关内容的区域。表征图像区域之间关系的全局特征在概率框架中融合在一起,以生成任意图像的区域排名图(RRM)。引入特征作为图像区域的空间位置,加权相似性和加权均匀性的地图。基于接收器的工作特性曲线,对RRM的进一步分析已用于生成表示测试图像中感兴趣区域的二进制图。该算法包括用于图像分割,特征提取和概率推理的模块。它与现有技术的不同之处在于,它使用机器学习技术来发现最佳的贝叶斯网络结构和概率推断。它还消除了在中间阶段进行语义理解的必要性。实验结果表明,一组公开提供的-4000幅彩色图像的准确率约为90%,并且与最新技术相比具有优势。该算法的应用包括智能图像和文档渲染,基于内容的图像检索,自适应图像压缩和编码以及自动图像注释。

著录项

  • 来源
    《Journal of electronic imaging》 |2010年第2期|P.023019.1-023019.13|共13页
  • 作者

    Mustafa I. Jaber; Eli Saber;

  • 作者单位

    Rochester Institute of Technology Chester F. Carlson Center for Imaging Science 54 Lomb Memorial Drive Rochester, New York 14623;

    rnRochester Institute of Technology Department of Electrical and Microelectronic Engineering 79 Lomb Memorial Drive Rochester, New York 14623;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-18 01:18:00

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