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首页> 外文期刊>Journal of Electron Microscopy >Crack propagation of single crystal β-Sn during in situ TEM straining
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Crack propagation of single crystal β-Sn during in situ TEM straining

机译:原位TEM应变过程中单晶β-Sn的裂纹扩展

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摘要

In situ tensile process of single-crystal Sn was investigated by transmission electron microscopy (TEM). Despite the traditional wedge microcrack, a new tetragonal microcrack was observed during crack propagation in the single-crystal Sn. During in situ tensile straining, the dislocation dipoles formed at the front of the wedge microcrack tip, the coalescence of which is the source of microvoids at the crack tip, and then the wedge microcrack propagated deeply by aggregation of discontinuous microvoids. The tetragonal microcrack propagated by the intersection along two vertical slip planes. Moreover, the series of high-resolution images showed that Sn islands formed at the center of the frontier crack plane due to the anisotropic self-diffusion of Sn atoms along different crystallographic planes.
机译:通过透射电子显微镜(TEM)研究了单晶Sn的原位拉伸过程。尽管有传统的楔形微裂纹,但在单晶Sn中的裂纹扩展过程中仍观察到新的四方微裂纹。在原位拉伸应变过程中,位错偶极子在楔形微裂纹尖端的前端形成,其聚结是裂纹尖端处微孔的来源,然后楔形微裂纹通过不连续微孔的聚集而深深地传播。四边形微裂纹由相交沿两个垂直滑移面传播。此外,一系列高分辨率图像显示,由于锡原子沿不同晶体平面的各向异性自扩散,锡岛形成在边界裂纹平面的中心。

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