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In situ observation of electric-field-induced domain switching and crack propagation in poled PMNT62/38 single crystals

机译:极化PMNT62 / 38单晶中电场诱导的畴转换和裂纹扩展的原位观察

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摘要

It is important to in situ observe the crack propagation and the corresponding domain switching in ferroelectrics subjected to electric loading since domain switching has been widely assumed to play a critical role in the electric-field-induced crack growth. In this investigation, we in situ observed the crack propagation and the domain switching in PMNT62/38 single crystals poled along the [001] orientation. An experimental setup was designed and constructed to investigate the crack propagation and the domain switching in thin plate specimens with pre-crack subjected to electric field by using polarized light microscope (PLM). The pre-crack began to propagate forward accompanied by the appearance of domain switching zones near the crack tip and the disappearance of switched zones behind the crack tip at the unipolar electric field of E=0.8E_C. The results indicate that the structure mismatch of the adjacent switched zones with different polarizations stimulated by the intensive electric field near the crack tip results in the electric-field-induced crack growth.
机译:重要的是,在电场作用下,在铁电体中原位观察裂纹扩展和相应的畴转换,因为已经广泛认为畴转换在电场诱导的裂纹扩展中起着至关重要的作用。在这项研究中,我们在原位观察了沿[001]取向极化的PMNT62 / 38单晶的裂纹扩展和畴转换。设计并构建了一个实验装置,以使用偏振光显微镜(PLM)研究带有预裂纹的薄板样品在电场作用下的裂纹扩展和畴转换。在E = 0.8E_C的单极电场下,预裂纹开始向前传播,伴随着裂纹尖端附近区域切换区的出现以及裂纹尖端后面转换区域的消失。结果表明,裂纹尖端附近的强电场所激发的具有不同极化的相邻开关区域的结构失配会导致电场引起的裂纹扩展。

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