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首页> 外文期刊>Journal of Crystal Growth >GaN-based blue light-emitting diodes grown and fabricated on patterned sapphire substrates by metalorganic vapor-phase epitaxy
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GaN-based blue light-emitting diodes grown and fabricated on patterned sapphire substrates by metalorganic vapor-phase epitaxy

机译:通过金属有机气相外延在图案化的蓝宝石衬底上生长和制造的GaN基蓝色发光二极管

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摘要

GaN-based blue light-emitting diodes (LEDs) with InGaN multi-quantum-wells were grown on patterned sapphire substrates by metalorganic vapor-phase epitaxy (MOVPE). The patterned substrates with 60-nm-deep parallel grooves of different dimensions along < 1120 > and < 1 0 1 0 > orientations were etched by BCl_3/Cl_2-based inductively coupled plasma reactive ion etching (ICP-RIE). Enhancement of the electroluminescence (EL) peak at 465 nm from LEDs grown on these grooves has been observed, in comparison with LEDs grown on unpatterned sapphire substrates. A maximum power increase of 25% was measured for LEDs grown on patterned substrate with 2 μm (ridge) x 4 μm (trench) grooves along the < 1 0 1 0 > orientation at a forward current of 20 mA at room temperature. Stronger light emission in the trench regions of the stripes at very low drive currents has been observed using optical microscopy. Several possible mechanisms are proposed to interpret this groove-induced EL enhancement.
机译:通过金属有机气相外延(MOVPE)在带图案的蓝宝石衬底上生长具有InGaN多量子阱的基于GaN的蓝色发光二极管(LED)。通过基于BCl_3 / Cl_2的电感耦合等离子体反应离子刻蚀(ICP-RIE)刻蚀具有沿<1120>和<1 0 1 0>方向不同尺寸的深60 nm平行凹槽的图案化基板。与在未图案化的蓝宝石衬底上生长的LED相比,已观察到这些沟槽上生长的LED在465 nm处的电致发光(EL)峰增强。在室温下,在正向电流为20 mA的情况下,沿着<1 0 1 0>方向在带有2μm(脊)x 4μm(沟槽)凹槽的带图案的基板上生长的LED上测量的最大功率增加为25%。使用光学显微镜已经观察到在非常低的驱动电流下在条纹的沟槽区域中的更强的发光。提出了几种可能的机制来解释这种凹槽引起的EL增强。

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