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Gas-source MBE growth of Ga(In)NP/GaP structures and their applications for red light-emitting diodes

机译:Ga(In)NP / GaP结构的气源MBE生长及其在红色发光二极管中的应用

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摘要

We have studied the effects on N incorporation in Ga(In)P and explored their applications for light-emitting diodes (LEDs). The GaInNP epilayers were grown on (100) GaP substrates by gas-source MBE using an RF nitrogen radical beam source. Red LEDs based on GaN_0.011P_0.989/GaP double-heterostructure grown on (100) GaP substrates were successfully fabricated. Compared to conventional A1GaInP LEDs, this LED eliminates etching of the GaAs substrate and wafer-bonding of a transparent GaP substrate. Partially relaxed GaN_0.011P_0.989 active layers, however, degraded the emission efficiency. Incorporation of In in GaN_0.015P_0.985 alloy to lattice-match to GaP not only maintains the direct band gap, but also improves the sample structural quality and increases the integrated PL intensity by 40/100, compared to GaN_0.985.
机译:我们已经研究了对Ga(In)P中N掺入的影响,并探讨了它们在发光二极管(LED)中的应用。使用射频氮自由基束源,通过气源MBE在(100)GaP衬底上生长GaInNP外延层。成功制造了在(100)GaP衬底上生长的基于GaN_0.011P_0.989 / GaP双异质结构的红色LED。与传统的AlGaInP LED相比,该LED消除了GaAs衬底的蚀刻和透明GaP衬底的晶圆键合。然而,部分松弛的GaN_0.011P_0.989有源层降低了发射效率。与GaN_0.985相比,在GaN_0.015P_0.985合金中掺入In以与GaP晶格匹配不仅保持了直接的带隙,而且还改善了样品结构质量,并使集成的PL强度提高了40/100。

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