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Initial preferred growth in zinc oxide thin films on Si and amorphous substrates by a pulsed laser deposition

机译:通过脉冲激光沉积在Si和非晶态衬底上的氧化锌薄膜的初始优选生长

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摘要

Zinc oxide (ZnO) thin films have been prepared on Si (001), Si (111), glass, and thermally grown SiO_2Si (001) substrates using a pulsed laser deposition. High-resolution transmission electron microscopy and selected-area electron diffraction showed that there are neither amorphous layer nor random oriented polycrystalline ZnO layer at the film/ substrates interfaces even if the films were formed at a relatively low substrate temperature of 400deg.C.
机译:已经使用脉冲激光沉积在Si(001),Si(111),玻璃和热生长的SiO_2Si(001)基板上制备了氧化锌(ZnO)薄膜。高分辨率透射电子显微镜和选择区域电子衍射表明,即使在400℃的较低基板温度下形成膜,在膜/基板界面处也没有非晶层或无规取向的多晶ZnO层。

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