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An Error Recoverable Structure Based on Complementary Logic and Alternating- Retry

机译:基于互补逻辑和交替重试的错误恢复结构

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Modern VLSI circuits provide adequate on-chip resources. So that online testing and retry integrated into a chip are absolutely necessary for system-on-a-chip technology. This paper firstly proposes a general online testing plus retrying structure. Obviously, although retry can mask transient or intermittent faults, it is useless for handling permanent faults generally. To solve this problem, this paper presents a novel dual modular redundancy (DMR) structure using complementary logic—alternating-complementary logic (CL-ACL) switching mode. During error-free operation, the CL-ACL structure operates by complementary logic mode. After an error is detected, it retries by alternating logic mode. If all errors belong to single or multiple temporary 0/1-error or stuck-at-error produced by one module, then these errors can be corrected effectively. The results obtained from the simulation validate the correctness of the CL-ACL structure. Analytic results show that the delay of the CL-ACL structure is dramatically less than that of a DMR structure using alternating-complementary logic mode.
机译:现代VLSI电路可提供足够的片上资源。因此,对于片上系统技术而言,集成到芯片中的在线测试和重试是绝对必要的。本文首先提出了一种通用的在线测试和重试结构。显然,尽管重试可以掩盖暂时性或间歇性故障,但通常对于处理永久性故障毫无用处。为了解决这个问题,本文提出了一种使用互补逻辑-交替互补逻辑(CL-ACL)切换模式的新型双模块冗余(DMR)结构。在无错误操作期间,CL-ACL结构以互补逻辑模式运行。检测到错误后,它将通过交替逻辑模式重试。如果所有错误属于一个模块产生的单个或多个临时0/1错误或卡在错误中,则可以有效地纠正这些错误。从仿真中获得的结果验证了CL-ACL结构的正确性。分析结果表明,CL-ACL结构的延迟明显小于使用交替互补逻辑模式的DMR结构的延迟。

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