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Flux Reversal in Rare‐Earth‐Substituted Yttrium Iron Garnets

机译:稀土置换钇铁石榴石的助焊剂逆转

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摘要

The switching properties of polycrystalline toroids of pure YIG (yttrium iron garnet) and YIG containing 1% Dy, 3% Dy, and 4% Sm have been measured over the temperature range 4.2° to 300°K. In each of the rare‐earth‐substituted materials, the field required to switch 50% of the flux in a given time shows a peak at a temperature which is approximately 0.4 times the temperature at which a peak is observed in the ferrimagnetic resonance linewidth. It is assumed that at low switching speeds flux reversal occurs by domain wall motion, and an explanation of the temperature dependence of the switching field is sought in a consideration of the effect of the loss mechanisms which determine the linewidth on the domain wall mobility. The field above threshold H - H0 required for complete dissipation of magnetostatic energy in the moving wall at a given domain wall velocity V, and thus a given switching speed, should be proportional to the linewidth at the effective precession frequency applicable to domain wall motion. For 180° domain walls this frequency is approximately Vπ/d, where d is the domain wall thickness. Measurements of the frequency dependence of the linewidth of rare‐earth‐substituted YIG have indicated that the loss mechanisms in these materials are ``slow'''' relaxation processes. For slow relaxation processes the linewidth is given by the expression ΔH (T, ωτ) = F (T)ωτ/1+ω2τ2, where ω is the experimental frequency and τ is the relaxation time. H - H0 (T, Vπτ/d) should depend in a similar way on Vπτ/d. This requires that Vπτ/d be a double‐valued function of H - H0, the higher value of which is inaccessible. The increase of ωτ beyond unity contributes to the decrease of the linewidth at low temperature, but the decrease in the -nswitching field at low temperature cannot be explained in this way. If the switching time chosen for reference were sufficiently short that at low temperatures Vπτ/d increases beyond unity, the required field would not be reduced but a discontinuous increase in switching speed, which is not observed, would occur at the field H - H0 (T, Vπτ/d=1). However, the behavior of the switching field is understandable if the explicit temperature dependence of H - H0 (T, Vπτ/d) is such as to produce the observed decrease at low temperature. A report of this work and related topics has been submitted for publication.
机译:已在4.2°至300°K的温度范围内测量了纯YIG(钇铁石榴石)和含1%Dy,3%Dy和4%Sm的YIG的多晶环形开关的开关性能。在每种稀土替代材料中,在给定时间内转换50%的通量所需的磁场在一个温度下显示一个峰值,该温度约为在亚铁磁共振线宽中观察到峰值的温度的0.4倍。假设在低开关速度下,磁畴反转是由畴壁运动引起的,并且考虑到确定线宽对畴壁迁移率的损耗机制的影响,寻求对开关场的温度依赖性的解释。在给定的畴壁速度V下,因此在给定的开关速度下,在运动壁中完全消除静磁能量所需的阈值H-H0之上的场应与适用于畴壁运动的有效进动频率下的线宽成比例。对于180°畴壁,该频率约为Vπ/ d,其中d是畴壁厚度。对稀土取代的YIG线宽的频率依赖性的测量表明,这些材料的损耗机理是``缓慢的''弛豫过程。对于慢弛豫过程,线宽由表达式ΔH(T,ωτ)= F(T)ωτ/ 1 +ω2τ2给出,其中ω是实验频率,τ是弛豫时间。 H-H0(T,Vπτ/ d)应该以类似的方式取决于Vπτ/ d。这要求Vπτ/ d是H-H0的双值函数,无法获得其较高的值。 ωτ的增加超过1会导致低温下线宽的减小,但是无法以这种方式解释低温下-n开关场的减小。如果选择的切换时间足够短,以至于在低温下Vπτ/ d会增加到超过1,则所需的磁场不会减少,但是会在磁场H-H0处出现开关速度的不连续增加(这没有观察到)。 T,Vπτ/ d = 1)。但是,如果H-H0(T,Vπτ/ d)的明确的温度依赖性导致在低温下产生观察到的降低,则开关场的行为是可以理解的。这项工作和相关主题的报告已提交出版。

著录项

  • 来源
    《Journal of Applied Physics》 |1964年第3期|共1页
  • 作者

    Palmer Wilfred;

  • 作者单位

    IBM T. J. Watson Research Center, Yorktown Heights, New York;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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