Widths of Transmission Kikuchi Lines in Silicon and Diamond

摘要

Detailed transmission Kikuchi patterns for silicon and diamond at 80 keV have been measured with high angular resolution (∼10-4 rad). Linewidths of all simple Bragg reflections are consistent with an elastic‐scattering model, which uses scattering amplitudes calculated by Ibers in a first Born approximation. Various interferences between strong Bragg reflections are observed.