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首页> 外文期刊>Journal of Applied Physics >Optical Determination of Cs Ground‐State Depletion in Cs‐Ar Low‐Pressure dc Discharges
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Optical Determination of Cs Ground‐State Depletion in Cs‐Ar Low‐Pressure dc Discharges

机译:光学确定Cs-Ar低压直流放电中Cs的基态损耗

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摘要

The results of an experimental study of the absorption properties of Cs as present in Cs‐Ar low‐pressure discharges under various discharge conditions are presented. The total Cs concentration at zero discharge current was varied between 1.5 and 15×1012 cm-3. Absorption was measured in the 4555‐Å and 8521‐Å lines of Cs from which the stationary concentration of Cs (62S1/2) could be derived. Special attention was paid to determine the Cs concentration as the discharge changed from a low‐burning voltage mode to a high‐burning voltage mode. The pronounced variations of the discharge properties were found to be accompanied by rather drastic changes of the Cs concentration for which variations of a factor of ten or more were found.
机译:给出了在各种放电条件下Cs-Ar低压放电中存在的Cs吸收特性的实验研究结果。零放电电流下的总Cs浓度在1.5和15×1012 cm-3之间变化。在Cs的4555-Å和8521-Å线中测量吸收,可以从中得出Cs的固定浓度(62S1 / 2)。当放电从低燃烧电压模式变为高燃烧电压模式时,要特别注意确定Cs浓度。发现放电特性的显着变化伴随着Cs浓度的相当剧烈的变化,对于该变化,发现了十倍或更大的变化。

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  • 来源
    《Journal of Applied Physics 》 |1967年第13期| 共4页
  • 作者

    Bleekrode R.;

  • 作者单位

    Philips Research Laboratories, N. V. Philips' Gloeilampenfabrieken, Eindhoven, Netherlands;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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