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High‐Field Conduction in Films of Mylar and Teflon

机译:聚酯薄膜和聚四氟乙烯薄膜中的高场传导

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摘要

Conduction currents in Mylar and Teflon films were measured at applied field strengths of 2–1400 kV·cm-1 and at a number of temperatures in the range 70°–163°C. The samples were carefully conditioned. The current varied with voltage as exp (αV01/2), and its temperature behavior was consistent with an activation process, giving an activation energy for conduction essentially independent of sample thickness, except at low fields. This change in activation energy with thickness at low fields, along with breaks in the Schottky plots are attributed to space‐charge effects. The data did not fit a hyperbolic sine relationship previously applied to this system in support of an ionic mechanism. The results are discussed in terms of available theories of conduction in solids.
机译:在施加的电场强度为2–1400 kV·cm-1且温度范围为70°–163°C的情况下,测量了聚酯薄膜和聚四氟乙烯薄膜中的导电电流。样品经过仔细处理。电流随电压随exp(αV01/ 2)的变化而变化,并且其温度行为与激活过程一致,除了在低电场下,其传导能量基本上与样品厚度无关。激活能随低场厚度的变化,以及肖特基图中的断裂均归因于空间电荷效应。数据不符合先前应用于离子系统的双曲线正弦关系。根据可用的固体传导理论讨论了结果。

著录项

  • 来源
    《Journal of Applied Physics》 |1968年第1期|共7页
  • 作者

    Lilly A. C.; McDowell John R.;

  • 作者单位

    Philip Morris Research Center, Richmond, Virginia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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