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首页> 外文期刊>Journal of Applied Physics >Hot‐Electron Distribution in n‐GaAs Derived from Photoluminescence Measurements with Applied Electric Field
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Hot‐Electron Distribution in n‐GaAs Derived from Photoluminescence Measurements with Applied Electric Field

机译:在外加电场的光致发光测量中得出的n-GaAs中的热电子分布

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摘要

Photoluminescence measurements have been made on thin, epitaxial layers of n‐GaAs to which an electric field is applied. Field‐dependent spectra are obtained corresponding to band‐to‐band recombination at 77 and 200°K, and from these the changes in electron distribution function are derived, allowance being made for the distributions of light and heavy holes. A fairly good agreement with theory is obtained, although variations between samples are too great to give clear support to the detailed model of Rees as opposed to the more phenomenologically drifted Maxwellian. The field suppression of the exciton peak is marked and is not adequately explained by present theory.
机译:已在施加电场的n-GaAs薄外延层上进行了光致发光测量。获得了与电场相关的光谱,对应于77和200°K下的带间重组,并由此推导了电子分布函数的变化,并考虑了轻孔和重孔的分布。尽管样本之间的差异太大,无法为Rees的详细模型提供清晰的支持,而不是从现象学上比较漂移的Maxwellian,但与理论已取得了很好的一致性。激子峰的场抑制是显着的,目前的理论没有充分解释。

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    《Journal of Applied Physics》 |1971年第7期|共7页
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  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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