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Dynamic and Steady‐State Injection of Electron‐Hole Plasma in p‐Type InSb

机译:在p型InSb中动态和稳态注入电子孔等离子体

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摘要

Potential measurements as a function of time and space show in detail the passage of an injected electron‐hole plasma front, and the eventual establishment of a nonequilibrium steady state in a long bar of p‐type InSb at 77°K. The front is preceded by a depletion layer which vanishes as plasma reaches the anode. Thereafter the current, with the voltage held constant, grows exponentially until just before the steady‐state plasma density is reached. These results are compared with a theory by Dean and by Ancker‐Johnson, Robbins, and Chang describing plasma injection into a semiconductor with deep traps. The measured front arrival time as a function of constant applied voltage agrees satisfactorily with Dean''s prediction. Four observations are at variance with his theory: the time constants of the exponential current growth are density‐dependent instead of being independent as predicted; the current at the front arrival is not a function of voltage as his theory states; the electric field behind the front is not proportional to the square root of distance; and the steady‐state injected current has a higher power dependence on voltage than the predicted square‐law dependence. The extended analysis accounts for all the observed growth time behavior, namely a growth time which is independent of steady‐state density at high and low densities, and which increases with density in the intermediate range. Also, a new theory of the steady‐state conduction characteristic, based on the density‐dependent plasma lifetime, reproduces quite well the measured conduction characteristics, I ∝ Vn with 2≪n≪8, until the interference of pinching, which causes a sub‐Ohmic conduction. In the nonequilibrium steady state the plasma density has a uniform spatial distribution within a factor of two over the central 80% of the sample length. The steady‐state den-nsity decreases monotonically from cathode to anode, or alternatively, a U‐shaped distribution is observed with high plasma densities occurring also at the anode, a characteristic which is attributed to copious hole injection. All the observed dynamic and steady‐state properties of double injection into p‐InSb are in good agreement with theory except for the constancy of the current magnitude at the front arrival and the form of the dependence of electric field on distance.
机译:随时间和空间变化的电位测量结果详细显示了注入的电子空穴等离子体前沿的通过,以及最终在77°K的p型InSb长棒中建立了非平衡稳态。前面是耗尽层,耗尽层随着等离子体到达阳极而消失。此后,在电压保持恒定的情况下,电流呈指数增长,直到刚好达到稳态等离子体密度。这些结果与Dean和Ancker-Johnson,Robbins和Chang的理论进行了比较,该理论描述了向具有深陷阱的半导体中注入等离子体。作为恒定施加电压的函数,测得的前到达时间与Dean的预测令人满意。有四个观察结果与他的理论不一致:指数电流增长的时间常数取决于密度,而不是像预期的那样独立。正如他的理论所言,前端到达的电流不是电压的函数;前面的电场与距离的平方根不成比例。稳态注入电流对电压的功率依赖性高于预测的平方律依赖性。扩展分析考虑了所有观察到的生长时间行为,即生长时间与高密度和低密度下的稳态密度无关,并且在中间范围内随密度增加而增加。同样,基于密度依赖的等离子体寿命的稳态传导特性的新理论很好地再现了测得的传导特性,I ∝ Vn和2≪n≪8,直到夹挤的干扰导致了‐传导不畅。在非平衡稳态下,血浆密度在样本长度的中心80%上具有两倍的因数内均匀的空间分布。稳态密度从阴极到阳极单调降低,或者观察到U形分布,阳极上也出现高等离子体密度,这归因于大量空穴注入。观察到的两次注入p-InSb的所有动态和稳态特性都与理论相吻合,除了前到达时电流大小的恒定性以及电场对距离的依赖形式。

著录项

  • 来源
    《Journal of Applied Physics 》 |1971年第2期| 共12页
  • 作者

    Anckeramp;

  • 作者单位

    Boeing Scientific Research Laboratories and University of Washington, Seattle, Washington 98124;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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