...
首页> 外文期刊>Journal of Applied Physics >A correlation method for semiconductor transient signal measurements
【24h】

A correlation method for semiconductor transient signal measurements

机译:半导体瞬态信号测量的相关方法

获取原文

摘要

A wide variety of experiments in semiconductor physics involve the observation of a particular class of time‐dependent transient signals; namely, decaying exponentials. Such signals are characteristic of systems relaxing back to equilibrium following an abrupt change in the populations of carriers occupying the available states. The magnitudes of such signals indicate the density of states involved, while the decay time constants (as a function of temperature) provide information on the energy level of the states in question. As such, both the amplitudes and the time constants of such signals are of physical interest. The problem of processing such signals has been examined using the theory of linear filtering and as a result a special purpose signal processor has been developed. This processor performs a continuous real‐time cross correlation between the experimental signals and an appropriately synchronized locally generated exponential waveform. The resulting system has been used to process signals from transient space‐charge measurements on reverse‐biased gold‐doped silicon junction diodes, providing both correlation spectra that yield energy levels and also trap profiles that expose the spatial distribution of the gold inside the junctions.
机译:半导体物理学中的各种实验涉及对特定类型的时间相关瞬态信号的观察。即衰减指数。这样的信号是系统在占据可用状态的载波数量突然变化之后恢复到平衡状态的特征。此类信号的幅度表示所涉及状态的密度,而衰减时间常数(作为温度的函数)提供有关所讨论状态的能级的信息。这样,这种信号的幅度和时间常数都是物理上有意义的。已经使用线性滤波理论研究了处理此类信号的问题,结果开发了一种专用信号处理器。该处理器在实验信号和适当同步的本地生成的指数波形之间执行连续的实时互相关。由此产生的系统已被用于处理来自反向偏置的金掺杂硅结二极管的瞬态空间电荷测量的信号,不仅提供产生能级的相关光谱,而且提供暴露结内金的空间分布的陷阱图。

著录项

  • 来源
    《Journal of Applied Physics 》 |1975年第6期| P.2638-2644| 共7页
  • 作者

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号