首页> 外文期刊>Journal of Applied Physics >A comparison of initial damage rates due to electron and neutron irradiations measured by internal friction techniques. I. Flux and temperature dependencies; scaling law
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A comparison of initial damage rates due to electron and neutron irradiations measured by internal friction techniques. I. Flux and temperature dependencies; scaling law

机译:通过内部摩擦技术测量的由于电子和中子辐照引起的初始损伤率的比较。 I.流量和温度依赖性;缩放定律

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The initial pinning rate of dislocations, as computed from changes in Young’s modulus, was measured in high‐purity polycrystalline copper during electron and neutron irradiations. For the same sample, flux and temperature dependencies of the pinning rate were studied for irradiations by 14.1‐MeV neutrons and 1.0‐ and 0.5‐MeV electrons. For a temperature of 330 K, the initial pinning rate depended on the flux to the 0.89±0.2 power in contradiction of simple kinetics. Additionally, to duplicate a given pinning rate due to a 14.1‐MeV neutron flux between 1011 and 1012 m-2 s-1, a 0.5‐MeV electron flux of 21.7±0.7 or a 1‐MeV electron flux of 2.2±0.1 times the neutron flux was necessary. Temperature dependence studies from 310 to 390 K showed the same dependence for neutron and electron irradiations. The difference in migration energies in the lattice and along the dislocations was found to be 0.18±0.02 eV over this temperature range. The copper sample exhibited the Simpson‐Sosin peaking of the decrement during all irradiations. The above observations lead us to conclude that the same defect, the interstitial, is responsible for pinning during both electron and neutron irradiation.
机译:根据杨氏模量的变化计算出的位错的初始钉扎速率是在电子和中子辐照期间在高纯度多晶铜中测量的。对于同一样品,研究了14.1MeV中子以及1.0MeV和0.5MeV电子对钉扎率的通量和温度依赖性。对于330 K的温度,与简单动力学相反,初始钉扎速率取决于0.89±0.2幂的通量。此外,由于在1011和1012 m-2 tos-1之间有14.1-MeV中子通量,所以要复制给定的钉扎率,则0.5-MeV电子通量为21.7±0.7或1-MeV电子通量为2.2±0.1倍中子通量是必要的。从310到390 K的温度依赖性研究表明,对中子和电子辐射的依赖性相同。在该温度范围内,发现晶格中和沿位错的迁移能差为0.18±0.02 eV。铜样品在所有辐照期间均显示出Simpson-Sosin峰的减量峰。上述观察结果使我们得出结论,在电子和中子辐照期间,相同的缺陷(间隙)是造成钉扎的原因。

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    《Journal of Applied Physics》 |1980年第7期|P.3684-3689|共6页
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  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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