Charging phenomenon in conductor‐insulator composites as displayed by the scanning electron microscope

摘要

Charging properties in conductor‐insulator composites have been studied with the scanning electron microscope. Use of this instrument as a charging and display device demonstrated its usefulness as an analytical technique for describing important properties of composite structures, such as filler dispersion, segregation, orientation, and electrical continuity. These scanning electron microscope charging micrographs can be used to characterize composites with a wide range of particle sizes (100 Å to over 10 μm).