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Effect of capacitance on I‐V characteristics of overdamped Josephson junctions: Classical and quantum limits

机译:电容对过阻尼约瑟夫逊结的I‐V特性的影响:经典和量子极限

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We have considered the effect of capacitance on the I‐V characteristics of a Josephson tunnel junction in the overdamped limit. Both thermal and quantum fluctuations limits have been investigated. In the framework of the washboard‐shaped potential the quantum and thermal fluctuations determine the time spent by the particle in and out of a potential well. These characteristic times have been calculated. The results allowed the possibility of obtaining the I‐V characteristics of the junctions. It is shown that for current I smaller than the critical Ic, I‐V curves with a higher slope correspond to larger capacitance values whereas for I≫Ic the curves with smaller capacitance lie above those with larger capacitance.
机译:我们已经考虑了电容对过阻尼极限中约瑟夫森隧道结的I-V特性的影响。已经研究了热和量子涨落极限。在搓板形电位的框架中,量子和热涨落决定了粒子进出势阱所花费的时间。已计算出这些特征时间。结果使获得结的I-V特性成为可能。结果表明,对于小于临界Ic的电流I,具有较高斜率的I-V曲线对应于较大的电容值,而对于I≫Ic,具有较小电容的曲线位于具有较大电容的曲线之上。

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    《Journal of Applied Physics》 |1984年第5期|P.1473-1476|共4页
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  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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