D. Adler, M. S. Shur, M. Silver, and S. R. Ovshinsky [J. Appl. Phys. 51, 3289 (1980)] propose that field‐induced filling of traps may lead to S‐shaped negative differential conductance (SNDC), and use the existence of two solutions of electron concentration for a given applied field as evidence for it. We comment on the conditions for this existence of two solutions and its significance to the SNDC.
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机译：D. Adler，M。S. Shur，M。Silver和S. R. Ovshinsky [J.应用物理51，3289（1980）]提出场致陷阱的填充可能导致S型负微分电导（SNDC），并使用给定应用场中电子浓度的两种解的存在作为证据。我们评论存在这两种解决方案的条件及其对SNDC的意义。
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