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首页> 外文期刊>Journal of Applied Physics >Optical emission actinometry and spectral line shapes in rf glow discharges
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Optical emission actinometry and spectral line shapes in rf glow discharges

机译:射频辉光放电中的光发射光化法和谱线形状

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Optical emission actinometry has been used recently as a means for estimating relative concentrations of radicals in rf plasmas. The technique relies upon normalization of the radical emission intensity to that from an inert gas (the actinometer) in order to compensate for changes in the electron density or energy distribution. However, actinometry is a valid measure of ground‐state densities only when the excited states are created by electron‐impact excitation (e.g., as opposed to chemiluminescent reactions or electron‐impact dissociation). When techniques such as laser‐induced fluorescence and optical‐absorption spectroscopy are available, there is little need to use actinometry. However, there are many instances where these techniques are not yet applicable or practical and the use of actinometry may be desirable. In such instances, a simple means of assessing the validity of an actinometer would be advantageous. We describe the use of emission line shapes for determining the mechanism of excited‐state formation and assessing the validity of an actinometer. In CF4/O2/Ar plasmas, both Ar* and F* are created with cold (360±70 K) translational distributions over a range of [F] from 0.4 to 4.0×1014 atoms cm-3. This implies that both species are created by electron‐impact excitation and that Ar can be used as an actinometer in determining [F]. In Cl2/Ar plasmas, however, Cl* and Ar* emission line shapes in the sheath show substantial broadening during the cathodic part of the rf cycle, which implies that other excitation mechanisms such as dissociation, attachment, ion impact, and charge exchange are important and that actinometry is not valid under these conditions. But, time‐averaged Cl* and Ar* emissions in the discharge center have identical linewidths, so that actinometry can be used to determine Cl atom-n concentrations.
机译:近来,光发射光化法已被用作估计射频等离子体中自由基的相对浓度的手段。该技术依赖于将自由基发射强度归一化为来自惰性气体(光化计)的强度,以便补偿电子密度或能量分布的变化。但是,仅当通过电子碰撞激发(例如,与化学发光反应或电子碰撞解离相反)创建激发态时,光化法才是衡量基态密度的有效方法。当可以使用激光诱导荧光和光学吸收光谱等技术时,几乎不需要使用光化法。但是,在许多情况下,这些技术尚不适用或不实用,可能需要使用光化法。在这种情况下,评估光化强度计有效性的简单方法将是有利的。我们描述了使用发射线形状来确定激发态形成的机理并评估光化计的有效性。在CF4 / O2 / Ar等离子体中,Ar *和F *都在0.4至4.0×1014原子×cm-3的[F]范围内具有冷(360±70 K)平移分布。这意味着这两种物质都是由电子碰撞激发产生的,并且Ar可以用作测定[F]的光度计。但是,在Cl2 / Ar等离子体中,鞘层中的Cl *和Ar *发射线形状在rf循环的阴极部分显示出明显的展宽,这暗示着其他激发机理,例如离解,附着,离子碰撞和电荷交换重要的是,在这种情况下光化法是无效的。但是,放电中心的时间平均Cl *和Ar *发射具有相同的线宽,因此可以使用光度法确定Cl原子的n浓度。

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    《Journal of Applied Physics 》 |1984年第2期| P.245-250| 共6页
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  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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