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Electronic band structures of Ge1-xSnx semiconductors: A first-principles density functional theory study

机译:Ge 1-x Sn x 半导体的电子能带结构:第一原理密度泛函理论研究

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We conduct first-principles total-energy density functional calculations to study the band structures in Ge1-xSnx infrared semiconductor alloys. The norm-conserving optimized pseudopotentials of Ge and Sn have been constructed for electronic structure calculations. The composition-bandgap relationships in Ge1-xSnx lattices are evaluated by a detailed comparison of structural models and their electronic band structures. The critical Sn composition related to the transition from indirect- to direct-gap in Ge1-xSnx alloys is estimated to be as low as x∼ 0.016 determined from the parametric fit. Our results show that the crossover Sn concentration occurs at a lower critical Sn concentration than the values predicted from the absorption measurements. However, early results indicate that the reliability of the critical Sn concentration from such measurements is hard to establish, since the indirect gap absorption is much weaker than the direct gap absorption. We find that the direct band gap decreases exponentially with the Sn composition over the range 0 and the alloys become metallic for x> 0.375, in very good agreement with the theoretical observed behavior [D. W. Jenkins and J. D. Dow, Phys. Rev. B 36, 7994, 1987]. For homonuclear and heteronuclear complexes of Ge1-xSnx alloys, the indirect band gap at L-pointis is found to decrease homonuclear Ge-Ge bonds or increase homonuclear Sn-Sn bonds as a result of the reduced L valley. All findings agree with previously reported experimental and theoretical results. The analysis suggests that the top of valence band exhibits the localization of bond charge and the bottom of the conduction band is composed of the Ge 4s4p and/or Sn 5s5p atomic orbits.
机译:我们进行第一性原理的总能量密度泛函计算,以研究Ge 1- x Sn x 红外半导体合金中的能带结构。 Ge和Sn的守恒守恒优化伪势已被构建用于电子结构计算。通过对结构模型及其电子能带结构的详细比较,评价了Ge 1-x Sn x 晶格中的组成带隙关系。据估计,与Ge 1-x Sn x 合金中从间接间隙转变为直接间隙的临界Sn组成低至 x〜< /方程> 0.016由参数拟合确定。我们的结果表明,交叉Sn浓度的临界Sn浓度低于吸收测量值预测的临界值。但是,早期结果表明,由于间接间隙吸收比直接间隙吸收要弱得多,因此很难确定此类测量中的临界Sn浓度的可靠性。我们发现,随着Sn组成在0 范围内,直接带隙呈指数下降,并且合金在 x> 0.375时变成金属态,与理论上观察到的行为[D. W. Jenkins和J. D. Dow,物理学。修订版B 36,7994,1987]。对于Ge 1-x Sn x 合金的同核和异核配合物,发现L点的间接带隙减少了同核Ge-Ge键或增加了同核Sn-由于降低的L谷,锡键。所有发现均与先前报道的实验和理论结果一致。分析表明,价带的顶部表现出键电荷的局部,而导带的底部则由Ge 4s4p 和/或Sn 5s5p 原子轨道组成。

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