Synchrotron x-ray computed microtomography for high pressure science

摘要

X-ray computed microtomography (XCT) has been a very promising and exciting technique for high pressure (HP) science since the introduction of the first HP setups optimized for tomography in the mid-2000s. Different experimental stations are now available using diamond anvil cells (DACs) or large volume presses, with their own benefits and limitations: access to very high pressures but at room temperature on one hand, high temperature (HT) at moderate pressures on the other, and slow acquisitions being an undesired common point between all techniques. We believe that we are at a turning point where current and future developments boost the interest of the technique for the HP community. Time-resolved experiments, with less than 1 s per tomogram, will become routinely available. Fast tomography will greatly reduce the problem of motion artifacts at HT, allowing new topics to be explored. Computing and data treatment issues must be taken into account to effectively exploit the large volumes of data produced. Foreseeable developments will allow higher pressures to be reached in larger volume presses and higher T in DACs. Furthermore, improved XCT resolution in large samples (several hundreds of μm in diameter) recorded in situ will offer to be an effective alternative to ex situ microscopy.