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首页> 外文期刊>Journal of Applied Physics >Non-uniform stresses in thin high temperature superconducting films under electromagnetic force: General models of curvature-stress relations and experimental results
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Non-uniform stresses in thin high temperature superconducting films under electromagnetic force: General models of curvature-stress relations and experimental results

机译:电磁力下薄高温超导膜中的不均匀应力:曲率应力关系的一般模型和实验结果

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摘要

Strong flux pinning in high temperature superconducting (HTS) film has significantly boosted its capability of carrying high currents; however, it, in turn, induces huge electromagnetic force in the HTS film, and hence film stress evaluation under electromagnetic force is indispensable for assessing their reliability. In this work, first, an analytical model is presented for evaluating the electromagnetic-forceinduced stresses in the thin HTS film that is placed in a vertical magnetic field. In this model, we relate curvatures to film stresses through electromagnetic body force, whose mechanism is very different from common film stress sources like misfit strain or thermo mismatch. The new model shows that the film stresses depend not only on the "local" curvatures at a same point of the substrate but also on the " nonlocal" curvatures of other points. Next, a coherent gradient sensor system for cryogenic measurement is implemented to monitor the stress states of the HTS film during the processes of magnetization and demagnetization. Finally, full fields of hoop stress, radial stress of the YBa2Cu3O7 - x film, and shear stress at interface between the film and the (00l) SrTiO3 substrate subjected to various magnetic fields are obtained, and all the stresses manifest irreversible behavior, which are first experimentally found in the thin HTS film- substrate system. Published under license by AIP Publishing.
机译:在高温超导(HTS)薄膜中的强助焊剂钉钉已显着提高其携带高电流的能力;然而,它又诱导HTS膜中的巨大电磁力,因此电磁力下的薄膜应力评估对于评估其可靠性是必不可少的。在这项工作中,首先,提出了一种分析模型,用于评估置于垂直磁场中的薄HTS膜中的电磁强化应力。在该模型中,我们通过电磁体力使曲率与胶片应力相关,其机制与普通膜应力源相差,如错配菌株或热不匹配。新模型表明,薄膜应力不仅取决于基板的同一点的“局部”曲率,还取决于其他要点的“非局部”曲率。接下来,实现用于低温测量的相干梯度传感器系统,以在磁化和退磁过程中监测HTS膜的应力状态。最后,获得了箍应力,YBA2Cu3O7 - X膜的径向应力,并获得膜与经过各种磁场的(00l)Srtio3基板的界面处的剪切应力,并且所有应力都是不可逆转的行为,即首先在薄的HTS薄膜衬底系统中发现。通过AIP发布在许可证下发布。

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  • 来源
    《Journal of Applied Physics》 |2019年第17期|175302.1-175302.11|共11页
  • 作者单位

    Lanzhou Univ Key Lab Mech Disaster & Environm Western China Minist Educ China Lanzhou 730000 Gansu Peoples R China|Lanzhou Univ Dept Mech & Engn Sci Coll Civil Engn & Mech Lanzhou 730000 Gansu Peoples R China;

    Lanzhou Univ Key Lab Mech Disaster & Environm Western China Minist Educ China Lanzhou 730000 Gansu Peoples R China|Lanzhou Univ Dept Mech & Engn Sci Coll Civil Engn & Mech Lanzhou 730000 Gansu Peoples R China;

    Lanzhou Univ Key Lab Mech Disaster & Environm Western China Minist Educ China Lanzhou 730000 Gansu Peoples R China|Lanzhou Univ Dept Mech & Engn Sci Coll Civil Engn & Mech Lanzhou 730000 Gansu Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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