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Photoluminescence enhancement of ZnO via coupling with surface plasmons on Al thin films

机译:通过与薄膜表面等离子体联接的光致发光提高ZnO

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摘要

We present that the ultra-violet emission of ZnO can be enhanced, as much as six-times its integral intensity, using an AI thin interlayer film between the Si substrate and ZnO thin film and a post-fabrication laser annealing process. The laser annealing is a cold process that preserves the chemical state and integrity of the underlying aluminum layer, while it is essential for the improvement of the ZnO performance as a light emitter and leads to enhanced emission in the visible and in the ultraviolet spectral ranges. In all cases, the metal interlayer enhances the intensity of the emitted light, either through coupling of the surface plasmon that is excited at the Al/ZnO interface, in the case of light-emitting ZnO in the ultraviolet region, or by the increased back reflection from the Al layer, in the case of the visible emission. In order to evaluate the process and develop a solid understanding of the relevant physical phenomena, we investigated the effects of various metals as inter-layers (Al, Ag, and Au), the metal interlayer thickness, and the incorporation of a dielectric spacer layer between Al and ZnO. Based on these experiments, Al emerged as the undisputable best choice of metal interlayers because of its compatibility with the laser annealing process, as well as due to its high optical reflectivity at 380 and 248 nm, which leads to the effective coupling with surface plasmons at the Al/ZnO interfaces at 380 nm and the secondary annealing of ZnO by the back-reflected 248 nm laser beam.
机译:我们认为,使用Si衬底和ZnO薄膜和后制造后激光退火工艺,可以增强ZnO的紫外线排放,多达六倍的整体强度。激光退火是一种冷工艺,可以保留下面铝层的化学状态和完整性,而是为了改善作为光发射器的ZnO性能的必要条件,并导致可见光和紫外光谱范围的增强的发射。在所有情况下,金属夹层通过在紫外线区域中发光ZnO的发光ZnO的情况下,通过在Al / ZnO界面激发的表面等离子体的偶联,或者通过增加的背部耦合来增强发射光的强度。在Al层的反射,在可见发射的情况下。为了评估该过程并制定对相关物理现象的稳定理解,我们研究了各种金属作为层间(A1,Ag和Au)的效果,金属层间厚度和介电间隔层的掺入在al和zno之间。基于这些实验,AL由于其与激光退火工艺的兼容性而被出现为金属夹层的无可争议的最佳选择,以及由于其在380和248nm处的高光学反射率,这导致与表面等离子体有效耦合通过后反射248nm激光束在380nm和ZnO的二次退火的Al / ZnO接口。

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  • 来源
    《Journal of Applied Physics》 |2017年第10期|103104.1-103104.6|共6页
  • 作者单位

    Department of Physics Aristotle University of Thessaloniki Thessaloniki GR-54124 Greece School of Science and Technology Nottingham Trent University Nottingham NGI1 8NS United Kingdom;

    School of Science and Technology Nottingham Trent University Nottingham NGI1 8NS United Kingdom;

    Department of Physics Aristotle University of Thessaloniki Thessaloniki GR-54124 Greece;

    Department of Physics Aristotle University of Thessaloniki Thessaloniki GR-54124 Greece;

    Department of Physics Aristotle University of Thessaloniki Thessaloniki GR-54124 Greece;

    School of Science and Technology Nottingham Trent University Nottingham NGI1 8NS United Kingdom;

    Department of Physics Aristotle University of Thessaloniki Thessaloniki GR-54124 Greece;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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