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Negative photoconductivity and hot-carrier bolometric detection of terahertz radiation in graphene-phosphorene hybrid structures

机译:石墨烯-磷烯杂化结构中太赫兹辐射的负光电导率和热载热辐射检测

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摘要

We consider the effect of terahertz (THz) radiation on the conductivity of the ungated and gated graphene (G)-phosphorene (P) hybrid structures and propose and evaluate the hot-carrier uncooled bolometric photodetectors based on the GP-lateral diodes (GP-LDs) and GP-field-effect transistors (GP-FETs) with the GP-channel. The operation of the GP-LDs and GP-FET photodetectors is associated with the carrier heating by the incident radiation absorbed in the G-layer due to the intraband transitions. The carrier heating leads to the relocation of a significant fraction of the carriers into the P-layer. Due to a relatively low mobility of the carriers in the P-layer, their main role is associated with a substantial reinforcement of the scattering of the carriers. The GP-FET bolometric photodetector characteristics are effectively controlled by the gate voltage. A strong negative conductivity of the GP-channel can provide much higher responsivity of the THz hot-carriers GP-LD and GP-FET bolometric photodetectors in comparison with the bolometers with solely the G-channels. Published under license by AIP Publishing.
机译:我们考虑了太赫兹(THz)辐射对非门控和门控石墨烯(G)-磷烯(P)杂化结构的电导率的影响,并基于GP侧向二极管(GP- LD)和带有GP通道的GP场效应晶体管(GP-FET)。 GP-LD和GP-FET光电探测器的操作与由于带内跃迁而在G层中吸收的入射辐射引起的载流子加热相关。载流子加热导致大部分载流子迁移到P层中。由于载流子在P层中的相对较低的迁移率,它们的主要作用与载流子的散射的显着增强有关。 GP-FET辐射热光电探测器的特性可通过栅极电压有效控制。与仅具有G通道的辐射热计相比,GP通道的强负电导率可以为THz热载流子GP-LD和GP-FET辐射热探测器提供更高的响应度。由AIP Publishing授权发布。

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  • 来源
    《Journal of Applied Physics》 |2019年第15期|151608.1-151608.11|共11页
  • 作者单位

    Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan|RAS, Inst Ultra High Frequency Semicond Elect, Moscow 117105, Russia|Moscow Inst Phys & Technol, Ctr Photon & Two Dimens Mat, Dolgoprudnyi 141700, Russia|Bauman Moscow State Tech Univ, Ctr Photon & Infrared Engn, Moscow 111005, Russia;

    Univ Aizu, Dept Comp Sci & Engn, Aizu Wakamatsu 9658580, Japan;

    RAS, Inst Ultra High Frequency Semicond Elect, Moscow 117105, Russia|Moscow Inst Phys & Technol, Ctr Photon & Two Dimens Mat, Dolgoprudnyi 141700, Russia;

    Moscow Inst Phys & Technol, Ctr Photon & Two Dimens Mat, Dolgoprudnyi 141700, Russia;

    Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan|SUNY Buffalo, Dept Elect Engn, Buffalo, NY USA;

    Rensselaer Polytech Inst, Dept Elect Comp & Syst Engn, Troy, NY 12180 USA|Rensselaer Polytech Inst, Dept Phys Appl Phys & Astron, Troy, NY 12180 USA|Elect Future Inc, Vienna, VA 22181 USA;

    Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan;

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