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Dipole scattering in highly polar semiconductor alloys

机译:高极性半导体合金中的偶极散射

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摘要

The wide gap polar semiconductors III-V nitrides, II-VI oxides, and ferroelectrics exhibit large spontaneous and piezoelectric polarization due to their nonsymmetric crystal structures. Electrical conductivity in alloys of such crystals is degraded by scattering from the varying polarization coupled to alloy disorder. We have modeled this effect by dipole scattering. We have calculated dipole scattering limited mobility in the relaxation time approximation of the Boltzmann equation. The results are applied to AlxGa1-xN layers coherently strained on GaN. For a typical carrier concentration of 10(18) (cm(-3)) in Al0.3Ga0.7N, dipole scattering limited mobilities are 2535 and 3420 (cm(2)/V s) at 300 and 77 K, respectively. Applying our results to ferroelectric alloys, we reach the interesting conclusion that dipole scattering in such alloys will lead to extremely low mobilities (1-10 cm(2)/V s), since it degrades as the square of average dipole moment. This leads us to suggest that digital alloy growth might be necessary to achieve high conductivities in highly polar wide gap alloy semiconductors and ferroelectrics for device applications. (C) 2004 American Institute of Physics.
机译:宽间隙极性半导体III-V氮化物,II-VI氧化物和铁电体由于其非对称晶体结构而表现出大的自发极化和压电极化。此类晶体的合金中的电导率因耦合到合金无序的极化变化引起的散射而降低。我们已经通过偶极子散射对该效应进行了建模。我们已经在玻尔兹曼方程的弛豫时间近似中计算了偶极子散射受限的迁移率。该结果适用于在GaN上相干应变的AlxGa1-xN层。对于Al0.3Ga0.7N中典型的10(18)(cm(-3))载流子浓度,在300和77 K时,偶极子散射限制的迁移率分别为2535和3420(cm(2)/ V s)。将我们的结果应用于铁电合金,我们得出有趣的结论,即此类合金中的偶极子散射将导致极低的迁移率(1-10 cm(2)/ V s),因为它会随着平均偶极矩的平方而降低。这使我们建议,数字合金生长可能对于在用于设备应用的高极性宽间隙合金半导体和铁电体中实现高电导率是必要的。 (C)2004美国物理研究所。

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