首页> 外文期刊>Journal of Applied Physics >A heuristic approach to precisely represent optical absorption and refractive index data for photon energies below, at, and above the band gap of semiconductors: The case of high-purity GaAs. Part I
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A heuristic approach to precisely represent optical absorption and refractive index data for photon energies below, at, and above the band gap of semiconductors: The case of high-purity GaAs. Part I

机译:一种启发式方法,可以精确表示低于或低于半导体的带隙的光子能量的光吸收和折射率数据:高纯度GaAs的情况。第一部分

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摘要

The existence of band tails even in nominally undoped and uncompensated GaAs, and the nonparabolic absorption shape above the band gap are the prime examples for the discrepancy between theory and experiments. To overcome this difficulty, we propose a heuristic approach that is guided by the fundamental theoretical aspects and the experimental facts. For this reason, we fit the available absorption data with exponential functions over a photon energy interval from below the band gap to 3 eV. This analytical representation remains well within the known experimental uncertainties over a temperature range from cryogenic to room temperature and beyond. The fitting functions are interpreted to represent the absorption contributions by the band tails, the continuum, and the excitons. This descriptive absorption function implicitly results from a perturbation of the imaginary part of the dielectric function that takes a host of unspecified contributions into account. The real part of the dielectric function due to the high-energy critical points is represented by Lorentzian functions with critical energies taken at 3 and 5 eV. Its square root defines the refractive index due to these critical points, n_h. The refractive index, n, is represented by the sum of n_h and the truncated Kramers-Kroenig transformation of the absorption function. The determination of n_h is made by fitting n to the precise refractive index data of Marple [J. Appl. Phys. 35, 1241 (1964)]. This procedure yields a very precise description ( < 0.1% below and within experimental uncertainty at and above the band gap) of the published refractive index data from 0 to 2.2 eV (except for the narrow reststrahl band near 0.033 eV) over a temperature range similar to that mentioned for the absorption function. We feel confident to predict the refractive index for temperatures as low as 4 K. An analytical expression for the refractive index describes the temperature and energy dependences very precisely below the band gap. The analytic expression is also very precise in the band-gap region for a temperature range estimated from 80 to 400 K. We also compare the form of the absorption function derived from photoluminescence spectra. We find that low quasiequilibrium carrier densities lead to important modifications of the absorption function. These experimental findings together with the fitting procedures serve as a basis for a heuristic theory to calculate the electronic and optical properties under injection.
机译:甚至在名义上未掺杂和未补偿的GaAs中,带尾的存在以及带隙上方的非抛物线吸收形状也是理论与实验之间差异的主要例子。为了克服这一困难,我们提出了一种启发式方法,该方法受基本理论方面和实验事实的指导。因此,我们在从带隙以下到3 eV的光子能量间隔内,将可用吸收数据与指数函数进行拟合。在从低温到室温以及更高的温度范围内,这种分析表示法仍很好地保持在已知的实验不确定性范围内。拟合函数被解释为表示带尾,连续体和激子的吸收贡献。该描述性吸收函数隐含地由介电函数的虚部的扰动引起,该扰动考虑了许多未指定的贡献。由于具有高能量临界点,介电函数的实部由具有3和5 eV的临界能量的洛伦兹函数表示。由于这些临界点n_h,其平方根定义了折射率。折射率n由n_h与吸收函数的截断式Kramers-Kroenig变换之和表示。 n_h的确定是通过将​​n拟合到Marple的精确折射率数据来完成的。应用物理35,1241(1964)]。此过程可在类似温度范围内对0至2.2 eV的已公布折射率数据(在0.033 eV附近的狭窄的斯特拉斯特尔带除外)进行非常精确的描述(在带隙处和带隙处及以下,在实验不确定度以下和范围内,误差小于0.1%)。提到的吸收功能。我们有信心预测低至4 K的温度的折射率。折射率的解析表达式非常精确地描述了带隙以下的温度和能量依赖性。在约80至400 K的温度范围内,带隙区域的解析表达式也非常精确。我们还比较了从光致发光光谱得出的吸收函数的形式。我们发现低的准平衡载流子密度导致吸收功能的重要改变。这些实验结果以及拟合过程为启发式理论的基础,以计算注入时的电子和光学性能。

著录项

  • 来源
    《Journal of Applied Physics》 |2005年第12期|p.123534.1-123534.12|共12页
  • 作者

    F. K. Reinhart;

  • 作者单位

    Laboratoire d'Optique Appliquee, Science et Techniques de l'Ingenieur (STI), Swiss Federal Institute of Technology, 1015 Lausanne, Switzerland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用物理学;
  • 关键词

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