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Finite element simulations of the laser-heated diamond-anvil cell

机译:激光加热金刚石-砧座单元的有限元模拟

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摘要

Axial and radial temperature gradients in the laser-heated diamond-anvil cell are examined using finite element simulations. Calculations are carried out for an optically thin silicate or oxide sample separated from the diamonds by an insulation medium and heated by a TEM_(00) mode from an infrared laser. The peak temperature of the simulations was chosen to be a representative value (2200 K) and sample dimensions are typical for experiments in the 20-50-GPa range. The distance between the anvils is 30 μm. The total temperature drop across the sample in the axial direction is controlled by two parameters: the filling fraction (thickness of sample/distance between anvils) and the ratio of thermal conductivity between the sample and insulator (k_S/k_I). The results of the numerical calculations agree well with a one-dimensional numerical model. For a sample filling fraction of 0.5, the axial temperature drop will range from about 1000 K (> 45%) for a thermal conductivity ratio of 1 to about 200 K (< 10%) for a conductivity ratio of 10. If the conductivity ratio between sample and insulator is reduced to 1, then a sample filling fraction of less than 0.1 is required to keep the axial temperature decrease to be less than 10%. The effects of asymmetric samples and variations in absorption length are also examined. For a given gasket thickness and conductivity ratio, we find that radial gradients are minimal at a filling fraction of about 50% and then increase at higher and lower filling ratios. The anvil surface remains close to room temperature in all calculations. Our results demonstrate that reduction of axial temperature variations in optically thin laser-heated samples requires the use of thick, low thermal conductivity insulation media.
机译:使用有限元模拟检查了激光加热的金刚石-砧座中的轴向和径向温度梯度。对通过绝缘介质从金刚石中分离出的光学稀薄的硅酸盐或氧化物样品进行了计算,并通过红外激光的TEM_(00)模式对其进行了加热。选择模拟的峰值温度作为代表值(2200 K),样品尺寸对于20-50 GPa范围内的实验是典型的。砧座之间的距离为30μm。轴向上整个样品的总温降由两个参数控制:填充率(样品的厚度/砧座之间的距离)和样品与绝缘体之间的导热系数(k_S / k_I)。数值计算的结果与一维数值模型非常吻合。对于0.5的样品填充率,对于1的热导率,轴向温度降落将在约1000 K(> 45%)的范围内,对于10的电导率,轴向温度降将在约200 K(<10%)的范围内如果样品和绝缘子之间的温度之间的差值减小到1,则需要将样品填充率控制在0.1以下以使轴向温度下降幅度小于10%。还检查了不对称样品的影响和吸收长度的变化。对于给定的垫片厚度和导电率,我们发现径向梯度在填充率约为50%时最小,然后在较高和较低的填充率时增加。在所有计算中,砧座表面均保持接近室温。我们的结果表明,要减小光学薄的激光加热样品的轴向温度变化,就需要使用厚的,低导热率的绝缘介质。

著录项

  • 来源
    《Journal of Applied Physics》 |2005年第11期|p.114902.1-114902.9|共9页
  • 作者

    Boris Kiefer; Thomas S. Duffy;

  • 作者单位

    Physics Department, New Mexico State University, Las Cruces, New Maxico 88003;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用物理学;
  • 关键词

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