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Similarities in photoluminescence in hafnia and zirconia induced by ultraviolet photons

机译:紫外光子诱导的氧化锆和氧化锆中光致发光的相似性

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Photoluminescence (PL) spectra induced by ultraviolet photons were measured for amorphous hafnia and zirconia deposited by plasma-enhanced chemical-vapor deposition (PECVD), amorphous hafnia deposited by pulse laser deposition, and crystalline yttria-stabilized zirconia. Two kinds of samples were prepared for both hafnia and zirconia deposited by PECVD using different source alkoxides in different deposition chambers. A PL peak was observed around 2,8 eV similarly in all hafnia and zirconia samples, irrespective of the difference in crystallinity, oxygen deficiency, source alkoxide, deposition method, or the substrate material. The decay profile of this PL is also similar in all the samples. These facts clearly show that neither impurities, oxygen vacancy, nor defects at the interface between the sample and the substrate are responsible for the PL. It is a luminescence inherent in hafnia and zirconia and is most likely due to radiative recombination between localized states at the band tails. When the samples were annealed in oxygen, a new PL peak appeared around 4.2 eV in all the amorphous samples. Its decay profile is also in common with these samples. Vacuum-ultraviolet absorption measurements and PL excitation measurements indicate that the 4.2-eV PL is excited due to the interband absorption.
机译:测量了由紫外线光子诱导的光致发光(PL)光谱,测量了通过等离子增强化学气相沉积(PECVD)沉积的非晶氧化and和氧化锆,通过脉冲激光沉积沉积的非晶氧化,以及氧化钇稳定的氧化锆。在不同的沉积室中使用不同的源醇盐制备了两种通过PECVD沉积的氧化和氧化锆样品。在所有氧化锆和氧化锆样品中,均在2.8 eV附近观察到一个PL峰,而与结晶度,氧缺乏,源醇盐,沉积方法或基底材料的差异无关。在所有样本中,该PL的衰减曲线也相似。这些事实清楚地表明,无论是杂质,氧空位还是样品与底物之间的界面缺陷都不是造成PL的原因。这是氧化f和氧化锆固有的发光,很可能是由于带尾处的局部状态之间的辐射复合。当样品在氧气中退火时,所有无定形样品中的新PL峰均出现在4.2 eV附近。这些样品的衰减曲线也相同。真空紫外吸收测量和PL激发测量表明,由于带间吸收,4.2 eV PL被激发。

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