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Optical activation of Eu ions in nanoporous GaN films

机译:纳米多孔GaN膜中Eu离子的光活化

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摘要

A systematic optical activation study of Eu-implanted nanoporous GaN films has been carried out as a function of ion dose and annealing temperature. The nanoporous GaN films are prepared by photoelectrochemical etching of n-type GaN films in HF-based electrolyte. Eu ions are implanted in both n-type GaN and n-type porous GaN films at 200 keV with doses ranging from 5 x 10~(14) to 5 x 10~(15) cm~(-2). For the implantation damage recovery and optical activation of Eu~(3+) ions, rapid thermal annealing is performed in the temperature range of 900-1200℃ under nitrogen ambient. The surface morphology of implanted porous GaN after different processing steps is characterized by scanning electron microscopy and the results show that porous morphology remains uniform even after ion implantation and high temperature processing. Microphotoluminescence and micro-Raman techniques have been used to investigate the optical properties of these Eu-implanted nanoporous films. Postimplantation annealing of both as-grown GaN and porous GaN films leads to the observation of strong photoluminescence (PL) peak around 622 nm, which is associated with the ~5D_0-~7F_2 intraionic transition of Eu~(3+) ions. We have observed that PL intensity of Eu-related luminescence peaks increases with annealing temperature up to 1100℃. In addition, due to efficient light extraction by surface nanostructuring, Eu-implanted porous GaN films show much stronger luminescence when compared to Eu-implanted as-grown GaN. Raman spectral analyses also indicate the optimum annealing condition for the implantation damage recovery and the compressive stress state in the Eu-implanted films.
机译:随离子注入剂量和退火温度的变化,对Eu注入的纳米多孔GaN薄膜进行了系统的光活化研究。通过在HF基电解质中对n型GaN膜进行光电化学蚀刻来制备纳米多孔GaN膜。 Eu离子以200 keV的剂量注入n型GaN和n型多孔GaN膜中,剂量范围为5 x 10〜(14)至5 x 10〜(15)cm〜(-2)。为了实现Eu〜(3+)离子的注入损伤恢复和光学活化,在氮气氛下,在900-1200℃的温度范围内进行快速热退火。通过扫描电子显微镜对经过不同处理步骤的多孔氮化镓的表面形貌进行了表征,结果表明,即使经过离子注入和高温处理,多孔形貌仍保持均匀。微光致发光和微拉曼技术已被用来研究这些these注入纳米多孔膜的光学性能。生长后的GaN和多孔GaN膜的植入后退火导致观察到622 nm附近的强光致发光(PL)峰,这与Eu〜(3+)离子的〜5D_0-〜7F_2离子内跃迁有关。我们已经观察到,Eu相关发光峰的PL强度随退火温度升高至1100℃而增加。另外,由于通过表面纳米结构有效地提取光,与注入Eu的成生长GaN相比,注入Eu的多孔GaN薄膜显示出更强的发光。拉曼光谱分析还表明了用于Eu注入膜中的注入损伤恢复和压应力状态的最佳退火条件。

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