首页> 外文期刊>Journal of Applied Physics >Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe
【24h】

Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe

机译:使用原子力显微镜探针进行精确力控制的动态力光谱测量

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

The accuracy of dynamic-force spectroscopy (DFS), a promising technique of analyzing the energy landscape of noncovalent molecular bonds, was reconsidered in order to justify the use of an atomic-force microscopy (AFM) cantilever as a DFS force probe. The advantages and disadvantages caused, for example, by the force-probe hardness were clarified, revealing the pivotal role of the molecular linkage between the force probe and the molecular bonds. It was shown that the feedback control of the loading rate of tensile force enables us a precise DFS measurement using an AFM cantilever as the force probe.
机译:为了考虑使用原子力显微镜(AFM)悬臂作为DFS力探针的合理性,重新考虑了动态力谱(DFS)的准确性,这是一种分析非共价分子键能量分布的有前途的技术。阐明了例如由测头硬度引起的优缺点,揭示了测力探针和分子键之间的分子键的关键作用。结果表明,张力加载速率的反馈控制使我们能够使用AFM悬臂作为力探头进行精确的DFS测量。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号