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Effect of elastic strain redistribution on electronic band structures of compressively strained GalnAsP/lnP membrane quantum wires

机译:弹性应变重新分布对压缩应变GalnAsP / lnP膜量子线电子能带结构的影响

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摘要

The effect of redistribution of elastic strain relaxation on the energy band structures of GalnAsP/InP compressively strained membrane quantum wires fabricated by electron-beam lithography, reactive-ion etching and two-step epitaxial growth is theoretically studied using an 8-band k·p method. Anisotropic strain analysis by the finite element method shows that due to etching away the top and the bottom InP clad layers in membrane structures, redistribution of strain occurs. It is found that strain redistribution increases the effective bandgap of membrane quantum wire structures causing a blueshift of the emission frequency. Comparison with effective bandgap calculations neglecting confinement and band mixing demonstrates that neglect of these effects leads to an overestimation of the change in the bandgap. We have also investigated the effect of variation of wire width, barrier strain compensation, number of stacked quantum wire layers, and thickness of the top and the bottom residual InP layers in membrane structures on the change in the effective bandgap of membrane structures.
机译:使用8波段k·p理论研究了电子束光刻,反应离子刻蚀和两步外延生长制备的GalnAsP / InP压缩应变膜量子线的能带结构对弹性应变弛豫的重新分布的影响。方法。通过有限元方法进行的各向异性应变分析表明,由于腐蚀掉了膜结构中的顶部和底部InP覆层,因此发生了应变的重新分布。发现应变的重新分布增加了膜量子线结构的有效带隙,导致发射频率的蓝移。与忽略限制和频带混合的有效带隙计算的比较表明,忽略这些影响会导致对带隙变化的高估。我们还研究了线宽变化,势垒应变补偿,量子线堆叠层数以及膜结构中顶部和底部残留InP层厚度对膜结构有效带隙变化的影响。

著录项

  • 来源
    《Journal of Applied Physics》 |2007年第9pt1期|p.093106.1-093106.5|共5页
  • 作者

    F. Ferdous; A. Haque;

  • 作者单位

    Department of Electrical and Electronic Engineering, Bangladesh University of Engineering and Technology, Dhaka-1000, Bangladesh;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用物理学;计量学;
  • 关键词

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