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首页> 外文期刊>Journal of Applied Physics >Space-charge-limited currents in organics with trap distributions: Analytical approximations versus numerical simulation
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Space-charge-limited currents in organics with trap distributions: Analytical approximations versus numerical simulation

机译:具有陷阱分布的有机物中受空间电荷限制的电流:分析近似与数值模拟

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摘要

Analytical approximations for space-charge-limited currents (SCLCs) in systems with exponential or Gaussian trap distributions were widely used in analyzing organic diodes. The current follows a power law with a transition into the trap-free SCLC at high voltages and an Ohmic low voltage limit. The power coefficient y is connected with either the decay constant or the variance of the distributions. Within these formulations, it is not possible to check the relevance of the numerous approximations needed to derive them. This concerns especially the relations of the contact work functions and of the layer thickness with the trap concentration, the position of the center of the trap distribution and its maximum value. Application of the analytical approximations to results of full numerical simulations allows one to set limits for the parameter ranges in which the approximations can be applied. In the case of the exponential distribution the analytical approximation is rather good for high trap concentrations and thicker layers. However, the simulations reveal a number of additional peculiarities. Such, the high voltage limit is usually not the trap-free SCLC but Ohmic and determined only by the anode barrier, the low voltage limit leads to a diodelike dependence with a large ideality factor and scaling with layer thickness and position of the trap distribution is extremely limited. In the case of the Gaussian trap distribution the simulations show indeed that the formula together with the connection between the power coefficient and the variance of the distribution fails completely. Thus, in principle, earlier analyzes of experimental data should be revised by using numerical simulations.
机译:在具有指数或高斯陷阱分布的系统中,空间电荷限制电流(SCLC)的分析近似被广泛用于分析有机二极管。电流遵循幂定律,在高电压和欧姆低电压限制下过渡到无陷阱SCLC。功率系数y与衰减常数或分布的方差相关。在这些公式中,不可能检查得出它们所需的众多近似的相关性。这尤其涉及接触功函数和层厚度与阱浓度,阱分布中心位置及其最大值之间的关系。将解析近似值应用于完整数值模拟的结果,可以为可应用近似值的参数范围设置极限。在指数分布的情况下,对于较高的阱浓度和较厚的层,分析近似值相当好。但是,仿真显示了许多其他特性。这样,高电压限制通常不是无陷阱的SCLC,而是欧姆阻抗,仅由阳极势垒决定,低电压限制导致二极管般的依赖关系,具有很大的理想因子,并且随层厚度和陷阱分布位置的变化而变化。非常有限。在高斯陷阱分布的情况下,仿真确实表明,公式以及功率系数与分布方差之间的联系完全失效。因此,原则上,应该通过使用数值模拟来修改实验数据的早期分析。

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  • 来源
    《Journal of Applied Physics》 |2009年第8期|084502.1-084502.9|共9页
  • 作者单位

    Leibniz Institute for Solid State and Materials Research, IFW Dresden, PF 270116, D-01171 Dresden, Germany;

    Institute of Solid State Electronics, Ilmenau Technical University, PF 100565, D-98684 Ilmenau, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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