机译:具有光致发光,霍尔迁移率和低频噪声的不同温度退火的氧化锌薄膜的点缺陷分析
Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research), 3 Research Link, Singapore 117602;
Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research), 3 Research Link, Singapore 117602;
Institute of Microelectronics, A*STAR (Agency for Science, Technology and Research), 11 Science Park Road, Singapore Science Park II, Singapore 117685;
Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research), 3 Research Link, Singapore 117602;
Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research), 3 Research Link, Singapore 117602;
机译:利用低频噪声和温度相关迁移率测量研究非晶铟镓锌氧化物薄膜晶体管的界面特性
机译:低温沉积氧化锌薄膜的本征光致发光与激光和热退火的关系
机译:氧化铟锌薄膜晶体管中随温度变化的漏极电流特性和低频噪声
机译:不同底物温度下RF溅射沉积的氧化锌薄膜的形态学和光致发光分析
机译:氢退火和衬底温度对射频溅射氧化锌薄膜性能的影响
机译:低温退火氧化锌纳米结构薄膜传感器:传感应用的表征
机译:低温沉积氧化锌薄膜的本征光致发光与激光和热退火的关系