机译:通过铝注入和脉冲准分子激光退火对p型硅(100)上的硅化物进行肖特基势垒高度调整
Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, 119260, Singapore;
Singapore Institute of Manufacturing Technology, A*STAR (Agency for Science, Technology and Research), 3 Research Link, 117602, Singapore;
Varian Semiconductor, 35 Dory Road, Gloucester, Massachusetts 01930, USA;
Varian Semiconductor, 35 Dory Road, Gloucester, Massachusetts 01930, USA;
Varian Semiconductor, 35 Dory Road, Gloucester, Massachusetts 01930, USA;
Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, 119260, Singapore;
Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, 119260, Singapore;
机译:通过铟注入在p型硅上调整硅化镍肖特基势垒高度
机译:肖特基势垒高度调整,通过离子注入到预先形成的硅化物薄膜中,然后进行驱入退火
机译:利用热退火和脉冲准分子激光退火对Si(100)衬底上的N型和P型3C-SiC进行表征
机译:铝隔离和脉冲激光退火的肖特基势垒高度调制:降低接触电阻的途径
机译:金/(100)砷化镓和金/硅化铂/(100)硅二极管的肖特基势垒高度和弹道电子传输特性的横向变化。
机译:硼铝双重注入与微波退火相结合对NiSi / Si接触处肖特基势垒高度的调节
机译:通过低温微波退火通过掺杂剂隔离技术调整肖特基势垒高度
机译:用于红外焦平面阵列的铂硅化物/ p型硅和铱硅化物/ p型硅肖特基势垒光电探测器的制造,微观结构表征和内部光响应