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首页> 外文期刊>Journal of Applied Physics >Soft magnetic properties of (Ni_(80)Fe_(20)1-x(Ni_(0.5)Zn_(0.5)Fe_2O_4)x films for high frequency applications
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Soft magnetic properties of (Ni_(80)Fe_(20)1-x(Ni_(0.5)Zn_(0.5)Fe_2O_4)x films for high frequency applications

机译:高频应用(Ni_(80)Fe_(20)1-x(Ni_(0.5)Zn_(0.5)Fe_2O_4)x薄膜的软磁性能

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摘要

A series of (Ni_(80)Fe_(20)1-x(Ni_(0.5)Zn_(0.5)Fe_20_4)x films were fabricated on Si substrates by means of radio frequency magnetron sputtering and the electrical and magnetic properties were studied. Optimal films with the desired properties of low coercivity H_c ~ 4 Oe, high saturation magnetization 4πMs~ 14.5 kG, and high electrical resistivity ρ~1500 μΩcm were obtained. The permeability spectra measured shows that its natural ferromagnetic resonant frequency was about 3.4 GHz. The tested results shown that the sputtering power had an important effect on the films properties and that it can be convenient to adjust the natural ferromagnetic resonant frequency of the films.
机译:利用射频磁控溅射在硅衬底上制备了一系列(Ni_(80)Fe_(20)1-x(Ni_(0.5)Zn_(0.5)Fe_20_4)x薄膜,并研究了其电学和磁学性质。获得了具有低矫顽力H_c〜4 Oe,高饱和磁化强度4πMs〜14.5 kG和高电阻率ρ〜1500μΩcm的理想薄膜,测得的磁导率光谱表明其自然铁磁谐振频率约为3.4 GHz。结果表明,溅射功率对薄膜的性能有重要影响,可以方便地调节薄膜的自然铁磁谐振频率。

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  • 来源
    《Journal of Applied Physics》 |2011年第2期|p.07A308.1-07A308.3|共3页
  • 作者单位

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China;

    Department of Physics and Astronomy, University of.Delaware, Newark, Delaware 19716, USA;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China;

    Department of Physics and Astronomy, University of.Delaware, Newark, Delaware 19716, USA;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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