首页> 外文期刊>Journal of Applied Physics >Nanoscale domain switchings of Bi_(3.15)Dy_(0.85)Ti_3O_(12) thin film under the simultaneous application of polarizing voltage and loading force
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Nanoscale domain switchings of Bi_(3.15)Dy_(0.85)Ti_3O_(12) thin film under the simultaneous application of polarizing voltage and loading force

机译:同时施加极化电压和加载力的Bi_(3.15)Dy_(0.85)Ti_3O_(12)薄膜的纳米级畴开关

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摘要

The nanoscale domain switchings of Bi_(3.15)Dy_(0.85)Ti_3O_(12) thin film annealed at 700℃ were observed by piezoresponse force microscopy under the different DC polarizing voltages, loading forces, and simultaneously both of them. Then, the formation mechanisms of domain switchings were analyzed from the perspective of dynamics of ferroelectric nanodomain and equilibrium state free energy of ferroelectric nanodomain. First, the 180° domain switchings were observed under the single polarizing voltages ±12 V. However, there are small amounts of anti-parallel domains. Second, the 90° domain switching was detected under the different single loading forces (150 and 300 nN). Finally, both 90° and 180° domain switchings were obtained under the simultaneously applied fields of polarizing voltage (+10 V) and loading forces (100 and 200 nN). The formation mechanisms of typical electric-generated nanoscale domain switchings were analyzed by forward domain-growth mechanism and grain deformation, and the abnormal electric-generated domain switching is interpreted by grain boundary effect and built-in electric field. Furthermore, we adopted the domain switching criterion from the perspective of equilibrium state free energy of ferroelectric nanodomain to uniformly explain the mechanisms of domain switchings induced by different external fields. It is necessary to understand the evolution mechanism of nanoscale domain switching for ferroelectric thin film devices.
机译:通过压电响应力显微镜观察了在不同的直流极化电压,加载力和同时作用下,在700℃退火的Bi_(3.15)Dy_(0.85)Ti_3O_(12)薄膜的纳米级域转换。然后,从铁电纳米畴的动力学和铁电纳米畴的平衡态自由能的角度分析了畴开关的形成机理。首先,在±12 V的单极化电压下观察到了180°域切换。但是,存在少量的反平行域。其次,在不同的单个加载力(150和300 nN)下检测到90°域切换。最后,在同时施加的极化电压(+10 V)和加载力(100和200 nN)的作用下,获得了90°和180°的域切换。通过正向生长机理和晶粒变形分析了典型的纳米尺度域开关的形成机理,并通过晶界效应和内置电场解释了异常的域开关。此外,我们从铁电纳米域的平衡态自由能的角度采用了域转换准则,以统一解释由不同外部场引起的域转换的机理。有必要了解铁电薄膜器件的纳米级域转换的演化机理。

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  • 来源
    《Journal of Applied Physics》 |2013年第4期|044110.1-044110.6|共6页
  • 作者单位

    Faculty of Materials and Optoelectronic Physics, Xiangtan University, Xiangtan, Hunan 411105, People's Republic of China;

    Faculty of Materials and Optoelectronic Physics, Xiangtan University, Xiangtan, Hunan 411105, People's Republic of China,School of Materials Science and Engineering, University of Shanghai for Science & Technology, Shanghai 200093, People's Republic of China;

    Faculty of Materials and Optoelectronic Physics, Xiangtan University, Xiangtan, Hunan 411105, People's Republic of China;

    Faculty of Materials and Optoelectronic Physics, Xiangtan University, Xiangtan, Hunan 411105, People's Republic of China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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