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Electronic density-of-states of amorphous vanadium pentoxide films: Electrochemical data and density functional theory calculations

机译:五氧化二钒非晶膜的电子态密度:电化学数据和密度泛函理论计算

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摘要

Thin films of V_2O_5 were prepared by sputter deposition onto transparent and electrically conducting substrates and were found to be X-ray amorphous. Their electrochemical density of states was determined by chronopotentiometry and displayed a pronounced low-energy peak followed by an almost featureless contribution at higher energies. These results were compared with density functional theory calculations for amorphous V_2O_5. Significant similarities were found between measured data and computations; specifically, the experimental low-energy peak corresponds to a split-off part of the conduction band apparent in the computations. Furthermore, the calculations approximately reproduce the experimental band gap observed in optical measurements.
机译:通过溅射沉积在透明的导电基底上制备了V_2O_5的薄膜,发现该薄膜是X射线无定形的。它们的电化学状态密度通过计时电位法确定,并显示出明显的低能量峰,随后在较高能量下几乎没有任何特征。将这些结果与无定形V_2O_5的密度泛函理论计算进行了比较。发现测量数据与计算之间存在显着相似性;具体来说,实验的低能峰对应于计算中明显的导带的分离部分。此外,该计算近似地再现了在光学测量中观察到的实验带隙。

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  • 来源
    《Journal of Applied Physics》 |2014年第18期|183701.1-183701.5|共5页
  • 作者单位

    Department of Engineering Sciences, The Angstroem Laboratory, Uppsala University, P.O. Box 534, SE-75121 Uppsala, Sweden;

    Department of Engineering Sciences, The Angstroem Laboratory, Uppsala University, P.O. Box 534, SE-75121 Uppsala, Sweden;

    Department of Physics and Astronomy, The Angstroem Laboratory, Uppsala University, P.O. Box 516, SE-75120 Uppsala, Sweden;

    Department of Physics and Astronomy, The Angstroem Laboratory, Uppsala University, P.O. Box 516, SE-75120 Uppsala, Sweden,Applied Materials Physics, Department of Materials and Engineering, Royal Institute of Technology (KTH), SE-100 44 Stockholm, Sweden;

    Department of Physics and Astronomy, The Angstroem Laboratory, Uppsala University, P.O. Box 516, SE-75120 Uppsala, Sweden,Applied Materials Physics, Department of Materials and Engineering, Royal Institute of Technology (KTH), SE-100 44 Stockholm, Sweden;

    Department of Engineering Sciences, The Angstroem Laboratory, Uppsala University, P.O. Box 534, SE-75121 Uppsala, Sweden;

    Department of Engineering Sciences, The Angstroem Laboratory, Uppsala University, P.O. Box 534, SE-75121 Uppsala, Sweden;

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