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机译:溅射气氛中残留氢对非晶In-Ga-Zn-O薄膜结构和性能的影响
Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan;
Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan;
Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan;
Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan,Materials Research Center for Element Strategy, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan;
National Institute for Materials Science, 1-2-1 Sengen, Tsukuba-city, Ibaraki 305-0047, Japan;
Materials Research Center for Element Strategy, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan,National Institute for Materials Science, 1-2-1 Sengen, Tsukuba-city, Ibaraki 305-0047, Japan;
Materials Research Center for Element Strategy, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan;
Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan,Materials Research Center for Element Strategy, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan;
Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan,Materials Research Center for Element Strategy, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan;
机译:射频溅射非晶In-Ga-Zn-O薄膜晶体管的二维数值模拟
机译:TFT应用的非晶ln-Ga-Zn-O薄膜中的氢阴离子和亚能级
机译:含氢气氛下沉积非晶钛酸钡薄膜的电学性能
机译:目标材料对射频磁控溅射沉积未氢化非晶硅薄膜结构和电性能的影响
机译:沉积过程中离子轰击对氢化非晶硅锗薄膜和光伏器件性能的影响。
机译:前驱体C2H2分数对磁控溅射沉积制备的含Si和Ag的非晶碳复合膜的组织和性能的影响
机译:溅射氢化物的结构和光学性质研究 非晶硅薄膜