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首页> 外文期刊>Journal of Applied Physics >On the role of spatial position of bridged oxygen atoms as surface passivants on the ground-state gap and photo-absorption spectrum of silicon nano-crystals
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On the role of spatial position of bridged oxygen atoms as surface passivants on the ground-state gap and photo-absorption spectrum of silicon nano-crystals

机译:关于桥接氧原子的空间位置作为表面钝化剂对硅纳米晶体基态间隙和光吸收光谱的作用

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摘要

Silicon nano-crystals (NCs) are potential candidates for enhancing and tuning optical properties of silicon for optoelectronic and photo-voltaic applications. Due to the high surface-to-volume ratio, however, optical properties of NC result from the interplay of quantum confinement and surface effects. In this work, we show that both the spatial position of surface terminants and their relative positions have strong effects on NC properties as well. This is accomplished by investigating the ground-state H0M0-LUM0 band-gap, the photo-absorption spectra, and the localization and overlap of HOMO and LUMO orbital densities for prototype ~1.2nm Si_(32-x)H_(42-2x)O_x hydrogenated silicon NC with bridged oxygen atoms as surface terminations. It is demonstrated that the surface passivation geometry significantly alters the localization center and thus the overlap of frontier molecular orbitals, which correspondingly modifies the electronic and optical properties of NC.
机译:硅纳米晶体(NC)是增强和调整光电子和光伏应用中硅的光学性能的潜在候选者。然而,由于高的表面体积比,NC的光学性质是由量子限制和表面效应的相互作用所导致的。在这项工作中,我们表明表面末端的空间位置及其相对位置对NC属性也有很强的影响。这是通过研究原型〜1.2nm Si_(32-x)H_(42-2x)的基态H0M0-LUM0带隙,光吸收光谱以及HOMO和LUMO轨道密度的定位和重叠来实现的O_x以桥接的氧原子作为表面末端的氢化硅NC。结果表明,表面钝化几何形状显着改变了定位中心,从而改变了前沿分子轨道的重叠,从而相应地改变了NC的电子和光学性质。

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  • 来源
    《Journal of Applied Physics 》 |2015年第20期| 205303.1-205303.6| 共6页
  • 作者单位

    School of Electrical and Computer Engineering, University of Tehran, Tehran 14395-515, Iran;

    School of Electrical and Computer Engineering, University of Tehran, Tehran 14395-515, Iran,Institute for Microelectronics, Technische Universitaet Wien, Gusshausstrasse 27-29/E360, Wien A-1040, Austria;

    School of Electrical and Computer Engineering, University of Tehran, Tehran 14395-515, Iran;

    Institute for Microelectronics, Technische Universitaet Wien, Gusshausstrasse 27-29/E360, Wien A-1040, Austria;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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