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Modeling of a metallic truncated cone for electromagnetic capacitive sensors

机译:用于电磁电容传感器的金属截锥的建模

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摘要

This paper presents an electromagnetic modeling of a grounded metallic truncated cone to be used for calibration purposes of a microwave imaging system. The basic idea is to demonstrate the equivalence between the cone and a cylinder having a suitable radius, in order to simplify the computation of its capacity with respect to ground. A mathematical expression for the capacitance of the uniform cylinder is presented, and its validity is confirmed by comparing the data provided by this formula with numerical values given by a commercial simulator. Starting from this analytic result, the model of the cone is presented, and a procedure for the choice of the cylinder radius is discussed in detail. This methodology can be applied to calculate the contribution to the stray capacitance of a metallic tip used for scanning probe microscopy, and specifically for microwave sensing applications. In particular, the capacitance due to the conic part of the probe can be quantified, an operation that is usually a difficult task when trying to separate it from contribution of the experimental setup. In our opinion, this issue is very important to improve the accuracy of system calibration in the scanning microwave microscopy technique.
机译:本文介绍了接地金属截锥的电磁模型,该模型将用于微波成像系统的校准。基本思想是证明圆锥体和具有适当半径的圆柱体之间的等效性,以便简化其相对于地面的承载力的计算。给出了均匀圆柱电容的数学表达式,并通过将该公式提供的数据与商用模拟器给出的数值进行比较,证实了其有效性。从这个分析结果开始,给出了圆锥的模型,并详细讨论了圆柱半径的选择过程。该方法可用于计算对用于扫描探针显微镜,特别是微波感测应用的金属尖端对杂散电容的贡献。特别是,可以量化由于探头的圆锥部分引起的电容,当试图将其与实验装置的贡献区分开时,通常这是一项艰巨的任务。我们认为,这个问题对于提高扫描微波显微镜技术中系统校准的准确性非常重要。

著录项

  • 来源
    《Journal of Applied Physics》 |2015年第7期|074503.1-074503.7|共7页
  • 作者单位

    CNR - Institute for Microelectronics and Microsystems, Via del Fosso del Cavaliere 100, 00133 Rome, Italy,Department of Electronic Engineering, University of Rome 'Tor Vergata,' Via del Politecnico 1, 00133 Rome, Italy;

    CNR - Institute for Microelectronics and Microsystems, Via del Fosso del Cavaliere 100, 00133 Rome, Italy;

    CNR - Institute for Microelectronics and Microsystems, Via del Fosso del Cavaliere 100, 00133 Rome, Italy;

    CNR - Institute for Microelectronics and Microsystems, Via del Fosso del Cavaliere 100, 00133 Rome, Italy;

    CNR - Institute for Microelectronics and Microsystems, Via del Fosso del Cavaliere 100, 00133 Rome, Italy;

    Department of Computer Engineering, Epoka University, Rruga Tiranee-Rinas, Km 12, 1039 Tirana, Albania;

    Department of Information Engineering, Electronics and Telecommunications, University of Rome 'La Sapienza,' Via Eudossiana 18, 00184 Rome, Italy;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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