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首页> 外文期刊>Journal of Applied Physics >The electron spin resonance study of heavily nitrogen doped 6H SiC crystals
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The electron spin resonance study of heavily nitrogen doped 6H SiC crystals

机译:重氮掺杂6H SiC晶体的电子自旋共振研究

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摘要

The magnetic and electronic properties of heavily doped n-type 6H SiC samples with a nitrogen concentration of 10~(19) and 4 × 10~(19)cm~(-3) were studied with electron spin resonance (ESR) at 5-150 K. The observed ESR line with a Dysonian lineshape was attributed to the conduction electrons (CE). The CE ESR (CESR) line was fitted by Lorentzian (insulating phase) (T< 40 K) and by Dysonian lineshape (metallic phase) above 40 K, demonstrating that Mott insulator-metal (IM) transition takes place at ~40 K, accompanied by significant change in the microwave conductivity. The temperature dependence of CESR linewidth follows the linear Korringa law below 40 K, caused by the coupling of the localized electrons (LE) and CE, and is described by the exponential law above 40 K related to the direct relaxation of the LE magnetic moments via excited levels driven by the exchange interaction of LE with CE. The g-factor of the CESR line (g_‖ = 2.0047(3), g_⊥ = 2.0034(3)) is governed by the coupling of the LE of nitrogen donors at hexagonal and quasi-cubic sites with the CE. The sharp drop in CESR line intensity (25-30 K) was explained by the formation of antiferromagnetic ordering in the spin system close to the IM transition. The second broad ESR line overlapped with CESR signal (5-25 K) was attributed to the exchange line caused by the hopping motion of electrons between occupied and non-occupied positions of the nitrogen donors. Two mechanisms of conduction, hopping and band conduction, were distinguished in the range of T= 10-25 K and T > 50 K, respectively.
机译:用电子自旋共振(ESR)研究了氮浓度为10〜(19)和4×10〜(19)cm〜(-3)的重掺杂n型6H SiC样品的磁性和电子性质。 150K。观察到的具有Dysonian线形的ESR线归因于传导电子(CE)。 CE ESR(CESR)线由Lorentzian(绝缘相)(T <40 K)和Dysonian线形(金属相)拟合(高于40 K),这表明Mott绝缘体-金属(IM)转变发生在〜40 K,伴随着微波电导率的显着变化。 CESR线宽的温度依赖性遵循40 K以下的线性Korringa定律,这是由局部电子(LE)和CE耦合引起的,并且由40 K以上的指数定律描述,其与LE磁矩的直接弛豫有关LE与CE的交换相互作用驱动激发水平。 CESR线的g因子(g_” = 2.0047(3),g_⊥= 2.​​0034(3))受制于六角形和准立方位置的氮供体的LE与CE耦合。 CESR线强度的急剧下降(25-30 K)可以通过在接近IM跃迁的自旋系统中形成反铁磁有序来解释。与CESR信号(5-25 K)重叠的第二条宽ESR线归因于交换线,该交换线是由氮供体的占据位置和非占据位置之间的电子跳跃运动引起的。分别在T = 10-25 K和T> 50 K的范围内区分了两种传导机制,即跳跃和带导。

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  • 来源
    《Journal of Applied Physics 》 |2015年第4期| 045708.1-045708.6| 共6页
  • 作者

    D. V. Savchenko;

  • 作者单位

    Institute of Physics AS CR, Prague 182 21, Czech Republic and V.E. Lashkaryov Institute of Semiconductor Physics, NASU, Kyiv 03028, Ukraine;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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