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机译:椭偏光谱法测定退火温度和Sn掺杂对赤铁矿薄膜光学性能的影响
Department of Physics, Federal University of Minas Gerais, Belo Horizonte 31270-901, Brazil;
Department of Physics, Federal University of Minas Gerais, Belo Horizonte 31270-901, Brazil;
Department of Physics, Federal University of Minas Gerais, Belo Horizonte 31270-901, Brazil;
Department of Physics, Federal University of Minas Gerais, Belo Horizonte 31270-901, Brazil;
Department of Physics, Federal University of Vicosa, Vicosa 36570-900, Brazil;
Department of Physics, Federal University of Minas Gerais, Belo Horizonte 31270-901, Brazil;
机译:退火温度对光谱椭圆形法分析氧化锌薄膜光学性质的影响
机译:Sn掺杂CulnO_2薄膜的电和光学性质:原子力显微镜和椭圆偏振光谱研究
机译:椭圆偏振光谱和拉曼散射测定的外延CdO薄膜的温度相关光学特性
机译:真空紫外椭圆偏振光谱法测定氮氧化硅薄膜的光学性能
机译:光谱反射法和椭圆偏振法测定固体薄膜的光学性能
机译:低温处理的Sn掺杂In2O3薄膜的电性能:微观结构和氧含量的作用以及缺陷调制掺杂的潜力
机译:错误:“用光谱椭圆形测定法研究的无定形和结晶SB掺杂SnO2薄膜的光学性质:光学间隙能量和有效质量”J。苹果。物理。 118,085303(2015)