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机译:硬X射线光电子能谱中背景分析确定的薄膜厚度和结构
Japan Synchrotron Radiation Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan;
Department of Physics, Chemistry and Pharmacy, University of Southern Denmark, DK-5230 Odense M,Denmark;
Japan Synchrotron Radiation Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan,SPring-8 Service Co., Ltd., 2-23-1 Kouto, Kamigori-cho, Ako-gun, Hyogo 678-1205, Japan;
Japan Synchrotron Radiation Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan,SPring-8 Service Co., Ltd., 2-23-1 Kouto, Kamigori-cho, Ako-gun, Hyogo 678-1205, Japan;
Nanoscience and Nanotechnology Research Center, Research Organization for the 21st Century,Osaka Prefecture University, 1-2 Gakuen-cho, Naka-ku, Sakai 599-8570, Japan,Precursory Research for Embryonic Science and Technology (PRESTO), Japan Science and Technology Agency (JST), 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan;
Japan Synchrotron Radiation Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan,SPring-8 Service Co., Ltd., 2-23-1 Kouto, Kamigori-cho, Ako-gun, Hyogo 678-1205, Japan;
Synchrotron X-ray Station at SPring-8, National Institute for Materials Science, 1-1-1 Kouto, Sayo-cho,Sayo-gun, Hyogo 679-5148, Japan;
Synchrotron X-ray Station at SPring-8, National Institute for Materials Science, 1-1-1 Kouto, Sayo-cho,Sayo-gun, Hyogo 679-5148, Japan;
Research Institute, Kochi University of Technology, Kami, Kochi 782-8502, Japan;
Japan Synchrotron Radiation Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan;
机译:硬质X射线光电子能谱和第一性原理研究类菱形和四方形BiFeO3薄膜的价带电子结构
机译:软和硬X射线光电子能谱分析复合氧化物薄膜中的能带偏移和SrTiO_3 / LaNiO_3和SrTiO_3 / GdTiO_3的异质结构
机译:硬x射线光电子能谱法研究外延NiTiSn和NiZr_(0.5)Hf_(0.5)Sn薄膜的电子结构和价态对称性
机译:p型a-Si:H / ZnO:Al和µc-Si:H / ZnO:Al薄膜太阳能电池结构-硬X射线光电子能谱比较研究
机译:X射线光电子能谱研究水溶液/液界面的溶质深度分布和黄铁矿薄膜的表面结构。
机译:X射线光电子能谱飞行时间二次离子质谱法和含NHS的有机薄膜的水解再生和反应性的主成分分析
机译:硬X射线光电子能谱中背景分析确定的薄膜厚度和结构