机译:用GaN中的a型螺钉位错直接观察倾斜的a型螺纹位错
Graduate School of Sciences and Technology for Innovation Yamaguchi University, Ube, Yamaguchi 755-8611, Japan ,UBE Scientific Analysis Laboratory, Inc., Ube, Yamaguchi, 755-0001, Japan;
Graduate School of Sciences and Technology for Innovation Yamaguchi University, Ube, Yamaguchi 755-8611, Japan;
Graduate School of Sciences and Technology for Innovation Yamaguchi University, Ube, Yamaguchi 755-8611, Japan;
Graduate School of Sciences and Technology for Innovation Yamaguchi University, Ube, Yamaguchi 755-8611, Japan;
Graduate School of Sciences and Technology for Innovation Yamaguchi University, Ube, Yamaguchi 755-8611, Japan;
Graduate School of Sciences and Technology for Innovation Yamaguchi University, Ube, Yamaguchi 755-8611, Japan;
机译:用X射线衍射法评估m-GaN膜中的a型螺丝位错
机译:堆叠断层域作为Ⅲ型氮化物异质结构中a型螺纹位错的来源
机译:Wurtzite GaN中空缺辅助核心转化和迁移调节A型边缘位错
机译:HVPE c平面生长的GaN晶片的曲率与倾斜螺纹位错引起的应力梯度的关系
机译:螺丝位错驱动一维纳米材料的生长。
机译:GaN中的螺纹位错和反域边界对倒易空间图的形状的影响
机译:Peierls型边缘的屏障和镁在镁中的基础和棱柱平面上移动的螺旋脱位
机译:通过高分辨率Z-对比成像直接观察GaN中的穿透位错