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首页> 外文期刊>Journal of Applied Physics >Lock-on physics in semi-insulating GaAs: Combination of trap-to-band impact ionization, moving electric fields and photon recycling
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Lock-on physics in semi-insulating GaAs: Combination of trap-to-band impact ionization, moving electric fields and photon recycling

机译:半绝缘GaAs中的锁定物理学:陷带碰撞电离,移动电场和光子回收的结合

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摘要

The time-dependent photoconductive current response of semi-insulating GaAs is probed based on one-dimensional simulations, with a focus on the lock-on phenomenon. Our results capture most of the experimental observations. It is shown that trap-to-band impact ionization fuels local field enhancements, and photon recycling also plays an important role in pushing the device towards lock-on above a 3.5 kV/cm threshold field. The results compare well with actual data in terms of the magnitudes, the rise times, and the oscillatory behavior seen at higher currents. Moving multiple domains are predicted, and the response shown depended on the location of the photoexcitation spot relative to the electrodes. Published by AIP Publishing.
机译:基于一维模拟,研究了半绝缘GaAs随时间变化的光电导电流响应,重点是锁定现象。我们的结果涵盖了大多数实验观察结果。结果表明,阱带间碰撞电离促进了局部电场的增强,光子回收在将设备推向高于3.5 kV / cm阈值电场的锁定状态时也起着重要作用。在幅度,上升时间和在较高电流下观察到的振荡行为方面,结果与实际数据相当吻合。预测了多个畴的移动,并且所示的响应取决于光激发点相对于电极的位置。由AIP Publishing发布。

著录项

  • 来源
    《Journal of Applied Physics 》 |2018年第8期| 085703.1-085703.10| 共10页
  • 作者单位

    Texas Tech Univ, Dept Elect & Comp Engn, Lubbock, TX 79409 USA;

    Texas Tech Univ, Dept Elect & Comp Engn, Lubbock, TX 79409 USA;

    Texas Tech Univ, Dept Elect & Comp Engn, Lubbock, TX 79409 USA;

    Ness Engn Inc, POB 261501, San Diego, CA 92196 USA;

    Texas Tech Univ, Dept Elect & Comp Engn, Lubbock, TX 79409 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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