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Thermomechanical Analysis of Film-on-Substrate System With Temperature-Dependent Properties

机译:随温度变化特性的基膜系统的热力学分析

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摘要

Thermomechanical analysis of global and local buckling is presented to show tempera-nture effects on the stress/strain and shape of a film-on-substrate system. First, the strainnis expressed as a function of three key temperatures (room, working, and deposit tem-nperatures). Through sensitivity analysis on temperature, polydimethylsiloxane (PDMS)nselection is determined to theoretically design film-on-substrate systems with the mini-nmum variation in stress caused by temperatures. Then, the wrinkling behaviors are stud-nied to establish the relationships of critical strain, wavelength, and amplitude with tem-nperature. In addition, the critical working temperature is determined for local buckling.nThe approximate semi-analytical solution and the finite element simulation are comparednby the use of a two-dimensional case of film on a half-space substrate.
机译:提出了对整体和局部屈曲的热力学分析,以显示温度对薄膜系统的应力/应变和形状的影响。首先,应变表示为三个关键温度(房间温度,工作温度和沉积温度)的函数。通过对温度的敏感性分析,确定了聚二甲基硅氧烷(PDMS)n-selection,以在理论上设计由温度引起的最小应力变化的基板上薄膜系统。然后,研究起皱行为以建立临界应变,波长和幅度与温度的关系。此外,还确定了局部屈曲的临界工作温度。n通过在半空间基板上使用二维膜的情况,比较了近似半解析解和有限元模拟。

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