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NUMERICAL STUDY OF STRESS RELAXATION IN NANOSTRUCTURES IN THE COURSE OF UNIAXIAL STRAINING

机译:单轴应变过程中纳米结构应力松弛的数值研究

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摘要

Stress relaxation in a nano-sized rod containing structural defects in the course of constant-rate uniaxial straining is studied, and the reasons for the onset of this phenomenon are determined. Under the assumption that structural defects can serve as carriers of irreversible strain of a higher level than dislocations, the problem is solved by the molecular dynamics method. It is found that stress relaxation is accompanied by the transition of the entire system to a steady state with a deeper potential minimum as compared to the system energy before the stress relaxation process, resulting in a temperature increase and reduction of the strain tensor components.
机译:研究了在恒定速率单轴应变过程中含有结构缺陷的纳米棒的应力松弛,并确定了这种现象发生的原因。在假设结构缺陷可以充当比位错更高水平的不可逆应变的载体的情况下,通过分子动力学方法解决了该问题。已经发现,与应力松弛过程之前的系统能量相比,应力松弛伴随着整个系统向稳态的过渡,具有最小的电位最小值,从而导致温度升高和应变张量分量的减小。

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