...
首页> 外文期刊>Journal of Analytical Atomic Spectrometry >Depth profiling of graphite electrode in lithium ion battery using glow discharge optical emission spectroscopy with small quantities of hydrogen or oxygen addition to argon
【24h】

Depth profiling of graphite electrode in lithium ion battery using glow discharge optical emission spectroscopy with small quantities of hydrogen or oxygen addition to argon

机译:锂离子电池中石墨电极的深度轮廓分析,采用辉光放电光发射光谱法,其中向氩气中添加了少量氢气或氧气

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Depth profiling and quantification using glow discharge optical emission spectroscopy (GD-OES) were applied to a graphite electrode in a lithium ion battery. To improve the measurement time and reliability beyond conventional argon discharge plasma, reactive sputtering with the respective addition of oxygen (0.50% v/v O_2 in Ar) and hydrogen (1.00% v/v H_2 in Ar) was investigated. Samples contained dispersed 0-5 wt% LiF or 0-0.5 wt% Li_3PO_4 in graphite electrodes. Adding oxygen to argon plasma increased the sputtering rate and the sensitivity in quantitative analysis of lithium drastically. That unexpected depth profile was obtained for graphite electrode samples possibly because chemical etching by oxygen was inhomogeneous. In contrast, adding hydrogen to argon plasma exhibited benefits both for depth profiling and for quantifying Li for graphite electrode samples with a shorter measurement time and higher sensitivity than that of conventional pure argon discharge. Molecular spectra showed strong C-H and C-C bands, suggesting that formation of volatile material fragments of CH and CC increased with hydrogen addition during measurements. Surface analysis results with SEM and XPS showed that redeposition of sputtered materials and Ar~+ ion implantation that occurred in pure argon plasma were also suppressed.
机译:使用辉光放电光发射光谱法(GD-OES)进行深度分析和定量分析,并应用于锂离子电池中的石墨电极。为了改善测量时间并提高可靠性,超越了传统的氩放电等离子体,研究了分别添加氧气(Ar中0.50%v / v O_2)和氢气(Ar中1.00%v / v H_2)的反应溅射。样品在石墨电极中包含分散的0-5 wt%LiF或0-0.5 wt%Li_3PO_4。在氩气等离子体中添加氧气可以大大提高溅射速率和锂定量分析的灵敏度。对于石墨电极样品,获得了意想不到的深度轮廓,这可能是因为氧的化学蚀刻是不均匀的。相比之下,向氩等离子体中添加氢气对于深度剖析和量化石墨电极样品中的Li均显示出优势,与传统的纯氩放电相比,测量时间更短,灵敏度更高。分子光谱显示强C-H和C-C谱带,表明在测量过程中,CH和CC挥发性物质碎片的形成随氢的添加而增加。 SEM和XPS的表面分析结果表明,纯氩等离子体中发生的溅射材料的再沉积和Ar〜+离子注入也得到了抑制。

著录项

  • 来源
    《Journal of Analytical Atomic Spectrometry》 |2014年第1期|95-104|共10页
  • 作者单位

    Rigaku Corporation, X-ray Instrument Division, 14-8 Akaoji-cho, Takatsuki, Osaka 569-1146, Japan,University of Hyogo, 2167, Shosha, Himeji, Hyogo 671-2280, Japan;

    Rigaku Corporation, X-ray Instrument Division, 14-8 Akaoji-cho, Takatsuki, Osaka 569-1146, Japan;

    Rigaku Corporation, X-ray Instrument Division, 14-8 Akaoji-cho, Takatsuki, Osaka 569-1146, Japan;

    University of Hyogo, 2167, Shosha, Himeji, Hyogo 671-2280, Japan;

    Central Research Institute of Electric Power Industry (CRIEPI), 2-11-1, Iwado Kita, Komae, Tokyo 201-8511, Japan;

    Central Research Institute of Electric Power Industry (CRIEPI), 2-11-1, Iwado Kita, Komae, Tokyo 201-8511, Japan;

    National Institute of Advanced Industrial Science and Technology (AIST), 1-8-31, Midorigaoka, Ikeda, Osaka 563-8577, Japan;

    National Institute of Advanced Industrial Science and Technology (AIST), 1-8-31, Midorigaoka, Ikeda, Osaka 563-8577, Japan;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号