Study on Polarization Properties of Randomly Oriented Bi_(3.35)La_(0.85)Ti_3O_(12) Ferroelectric Thin Film Utilizing Three-Dimensional Piezoresponse Image

摘要

We investigated the domain structures of randomly oriented Bi_(3.35)La_(0.85)Ti_3O_(12) (BLT) ferroelectric thin films by mapping the three-dimensional piezoresponse images of the film. Such BLT films were prepared by the sol-gel method. The domain arrangement in the patterned BLT thin films without a top electrode was recorded along all three components of the x-, y- and z-axes by monitoring lateral deflection and vertical displacement. In particular, to obtain lateral deflection along the y-axis, the patterned sample was physically rotated by 90°. In addition, polarization reversal was investigated by applying dc voltage through a conductive tip during the area scanning. We observed that various types of domain behavior such as 54.7° and 90° domain switchings, and pinned domain formation occurred.